Marilyn I. Wright

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having an organic anti-reflective coating (ARC...
- Patent number 8,039,389
- Issue date Oct 18, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Douglas M. Reber
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Process for design of semiconductor circuits
- Patent number 7,861,195
- Issue date Dec 28, 2010
- Advanced Mirco Devices, Inc.
- Darin A. Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining grid dimensions using scattero...
- Patent number 7,262,864
- Issue date Aug 28, 2007
- Advanced Micro Devices, Inc.
- Richard J. Markle
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having an organic anti-reflective coating (ARC...
- Patent number 7,199,429
- Issue date Apr 3, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Douglas M. Reber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capping layer for reducing amorphous carbon contamination of photor...
- Patent number 7,109,101
- Issue date Sep 19, 2006
- AMD, Inc.
- Marilyn I. Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having an organic anti-reflective coating (ARC...
- Patent number 6,972,255
- Issue date Dec 6, 2005
- FREESCALE SEMICONDUCTOR, INC.
- Douglas M. Reber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for patterning a feature using a trimmed hardmask
- Patent number 6,913,958
- Issue date Jul 5, 2005
- Advanced Micro Devices
- Marina V. Plat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antireflective bi-layer hardmask including a densified amorphous ca...
- Patent number 6,900,002
- Issue date May 31, 2005
- Advanced Micro Devices, Inc.
- Marina V. Plat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
L-shaped spacer incorporating or patterned using amorphous carbon o...
- Patent number 6,893,967
- Issue date May 17, 2005
- Advanced Micro Devices, Inc.
- Marilyn I. Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CVD organic polymer film for advanced gate patterning
- Patent number 6,864,556
- Issue date Mar 8, 2005
- Advanced Micro Devices, Inc.
- Lu You
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining contact opening dimensions usi...
- Patent number 6,804,014
- Issue date Oct 12, 2004
- Advanced Micro Devices, Inc.
- Richard J. Markle
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining critical dimension variation i...
- Patent number 6,773,939
- Issue date Aug 10, 2004
- Advanced Micro Devices, Inc.
- Marilyn I. Wright
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for identifying misregistration in a complimen...
- Patent number 6,774,998
- Issue date Aug 10, 2004
- Advanced Micro Devices, Inc.
- Marilyn I. Wright
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for reducing gate line deformation and reducing gate line wi...
- Patent number 6,764,947
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Darin Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting necking over field/active transi...
- Patent number 6,766,215
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Method for reducing pattern deformation and photoresist poisoning i...
- Patent number 6,764,949
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Douglas J. Bonser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for performing overlay measurements using scat...
- Patent number 6,716,646
- Issue date Apr 6, 2004
- Advanced Micro Devices, Inc.
- Marilyn I. Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for analyzing line structures
- Patent number 6,697,153
- Issue date Feb 24, 2004
- Advanced Micro Devices, Inc.
- Marilyn I. Wright
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting necking over field/active transi...
- Patent number 6,657,716
- Issue date Dec 2, 2003
- Advanced Micro Devices Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining column dimensions using scatte...
- Patent number 6,650,423
- Issue date Nov 18, 2003
- Advanced Micro Devices Inc.
- Richard J. Markle
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for monitoring wafer stress
- Patent number 6,509,201
- Issue date Jan 21, 2003
- Advanced Micro Devices, Inc.
- Marilyn I. Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining process layer conformality
- Patent number 6,479,309
- Issue date Nov 12, 2002
- Advanced Micro Devices, Inc.
- Marilyn I. Wright
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for optical film stack fault detection
- Patent number 6,458,610
- Issue date Oct 1, 2002
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing the effects of shadowing of angled halo implants
- Patent number 6,426,262
- Issue date Jul 30, 2002
- Advanced Micro Devices, Inc.
- Mark Brandon Fuselier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Poly gate CD passivation for metrology control
- Patent number 6,261,936
- Issue date Jul 17, 2001
- Advanced Micro Devices, Inc.
- Marilyn I. Wright
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROCESS FOR DESIGN OF SEMICONDUCTOR CIRCUITS
- Publication number 20090193369
- Publication date Jul 30, 2009
- Advanced Micro Devices, Inc.
- Darin A. Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING AN ORGANIC ANTI-REFLECTIVE COATING (ARC...
- Publication number 20070141770
- Publication date Jun 21, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Douglas M. Reber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having an organic anti-reflective coating (ARC...
- Publication number 20050181596
- Publication date Aug 18, 2005
- Douglas M. Reber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having an organic anti-reflective coating (ARC...
- Publication number 20050026338
- Publication date Feb 3, 2005
- Douglas M. Reber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for reducing pattern deformation and photoresist poisoning i...
- Publication number 20040023475
- Publication date Feb 5, 2004
- Advanced Micro Devices, Inc.
- Douglas J. Bonser
- H01 - BASIC ELECTRIC ELEMENTS

Marilyn I. Wright

Person

Patents Grantslast 30 patents

Semiconductor device having an organic anti-reflective coating (ARC...

Process for design of semiconductor circuits

Method and apparatus for determining grid dimensions using scattero...

Semiconductor device having an organic anti-reflective coating (ARC...

Capping layer for reducing amorphous carbon contamination of photor...

Semiconductor device having an organic anti-reflective coating (ARC...

Method for patterning a feature using a trimmed hardmask

Antireflective bi-layer hardmask including a densified amorphous ca...

L-shaped spacer incorporating or patterned using amorphous carbon o...

CVD organic polymer film for advanced gate patterning

Method and apparatus for determining contact opening dimensions usi...

Method and apparatus for determining critical dimension variation i...

Method and apparatus for identifying misregistration in a complimen...

Method for reducing gate line deformation and reducing gate line wi...

Method and apparatus for detecting necking over field/active transi...

Method for reducing pattern deformation and photoresist poisoning i...

Method and apparatus for performing overlay measurements using scat...

Method and apparatus for analyzing line structures

Method and apparatus for detecting necking over field/active transi...

Method and apparatus for determining column dimensions using scatte...

Method and apparatus for monitoring wafer stress

Method and apparatus for determining process layer conformality

Method and apparatus for optical film stack fault detection

Method of analyzing the effects of shadowing of angled halo implants

Poly gate CD passivation for metrology control

Patents Applicationslast 30 patents

PROCESS FOR DESIGN OF SEMICONDUCTOR CIRCUITS

SEMICONDUCTOR DEVICE HAVING AN ORGANIC ANTI-REFLECTIVE COATING (ARC...

Semiconductor device having an organic anti-reflective coating (ARC...

Semiconductor device having an organic anti-reflective coating (ARC...

Method for reducing pattern deformation and photoresist poisoning i...