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Mario A. Maldari
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Stow, MA, US
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last 30 patents
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Patent Grant
Particle detection method and apparatus
Patent number
4,895,446
Issue date
Jan 23, 1990
Inspex Incorporated
Mario A. Maldari
G01 - MEASURING TESTING
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Patent Grant
Particle detection method and apparatus
Patent number
4,772,126
Issue date
Sep 20, 1988
Inspex Incorporated
Charly D. Allemand
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for detecting particles on a material
Patent number
4,377,340
Issue date
Mar 22, 1983
Hamamatsu Systems, Inc.
Gary P. Green
G01 - MEASURING TESTING