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Mario B. Viani
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Santa Barbara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Modular atomic force microscope with environmental controls
Patent number
10,416,190
Issue date
Sep 17, 2019
Oxford Instruments Asylum Research Inc
Mario Viani
G01 - MEASURING TESTING
Information
Patent Grant
Fully digitally controller for cantilever-based instruments
Patent number
10,107,832
Issue date
Oct 23, 2018
Oxford Instruments PLC
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Grant
Fully digitally controller for cantilever-based instruments
Patent number
9,689,890
Issue date
Jun 27, 2017
Oxford Instruments PLC
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Modular atomic force microscope with environmental controls
Patent number
9,581,616
Issue date
Feb 28, 2017
Oxford Instruments Asylum Research, Inc.
Mario Viani
G01 - MEASURING TESTING
Information
Patent Grant
Modular atomic force microscope with environmental controls
Patent number
9,097,737
Issue date
Aug 4, 2015
Oxford Instruments Asylum Research, Inc.
Mario Viani
G01 - MEASURING TESTING
Information
Patent Grant
Fully digitally controller for cantilever-based instruments
Patent number
8,925,376
Issue date
Jan 6, 2015
Oxford Instruments PLC
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Modular atomic force microscope
Patent number
8,370,960
Issue date
Feb 5, 2013
Asylum Research Corporation
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Fully digitally controller for cantilever-based instruments
Patent number
8,205,488
Issue date
Jun 26, 2012
Asylum Research Corporation
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Fully digitally controller for cantilever-based instruments
Patent number
7,937,991
Issue date
May 10, 2011
Asylum Research Corporation
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Fully digital controller for cantilever-based instruments
Patent number
7,234,342
Issue date
Jun 26, 2007
Asylum Research Corporation
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Grant
Microfabrication of cantilevers using sacrificial templates
Patent number
6,016,693
Issue date
Jan 25, 2000
The Regents of the University of California
Mario B. Viani
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
Publication number
20170292971
Publication date
Oct 12, 2017
OXFORD INSTRUMENTS PLC
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Modular Atomic Force Microscope
Publication number
20170254834
Publication date
Sep 7, 2017
OXFORD INSTRUMENTS PLC
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Application
Modular Atomic Force Microscope with Environmental Controls
Publication number
20170168089
Publication date
Jun 15, 2017
Oxford Instruments Asylum Research, Inc.
Mario Viani
G01 - MEASURING TESTING
Information
Patent Application
Modular Atomic Force Microscope with Environmental Controls
Publication number
20150338438
Publication date
Nov 26, 2015
Oxford Instruments Asylum Research, Inc.
Mario Viani
G01 - MEASURING TESTING
Information
Patent Application
Modular atomic force microscope with environmental controls
Publication number
20150150163
Publication date
May 28, 2015
Oxford Instruments Asylum Research, Inc.
Mario Viani
G01 - MEASURING TESTING
Information
Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
Publication number
20150113687
Publication date
Apr 23, 2015
OXFORD INSTRUMENTS PLC
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Modular Atomic Force Microscope
Publication number
20140223612
Publication date
Aug 7, 2014
ASYLUM CORPORATION
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
Publication number
20120266336
Publication date
Oct 18, 2012
ASYLUM RESEARCH CORPORATION
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
Publication number
20100333240
Publication date
Dec 30, 2010
ASYLUM RESEARCH CORPORATION
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Modular atomic force microscope
Publication number
20100275334
Publication date
Oct 28, 2010
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Fully digitally controller for cantilever-based instruments
Publication number
20080011067
Publication date
Jan 17, 2008
ASYLUM RESEARCH CORPORATION
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Fully digital controller for cantilever-based instruments
Publication number
20040206166
Publication date
Oct 21, 2004
Roger Proksch
G01 - MEASURING TESTING