Mario W. Overhoff

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Cincinnati, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Surface radiation detector
- Patent number 5,539,208
- Issue date Jul 23, 1996
- Mario W. Overhoff
- G01 - MEASURING TESTING
Information Patent Grant
High resolution measurement of moving materials using a scintillati...
- Patent number 4,899,298
- Issue date Feb 6, 1990
- Mario W. Overhoff
- G01 - MEASURING TESTING
Information Patent Grant
Alpha particle monitor
- Patent number 4,262,203
- Issue date Apr 14, 1981
- Mario W. Overhoff
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Ionization chamber detector system for the detection and measuremen...
- Publication number 20040251422
- Publication date Dec 16, 2004
- Mario W. Overhoff
- G01 - MEASURING TESTING