Mark A. Banke

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for a low-cost semiconductor test interface system
- Patent number 8,786,301
- Issue date Jul 22, 2014
- Altera Corporation
- Adam J. Wright
- G01 - MEASURING TESTING
Information Patent Grant
Probe cards with minimized cross-talk
- Patent number 8,466,704
- Issue date Jun 18, 2013
- Altera Corporation
- Aman Aflaki Beni
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for a low-cost semiconductor test interface system
- Patent number 7,768,280
- Issue date Aug 3, 2010
- Altera Corporation
- Adam J. Wright
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for laser marking of integrated circuit faults
- Patent number 7,020,582
- Issue date Mar 28, 2006
- Altera Corporation
- John M. Dicosola
- G01 - MEASURING TESTING