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Mark A. De Samber
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Eindhoven, NL
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last 30 patents
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Patent Grant
X-ray examination apparatus comprising a filter
Patent number
6,188,749
Issue date
Feb 13, 2001
U.S. Philips Corporation
Christoph Schiller
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Patent Grant
Semiconductor device provided with a microcomponent having a fixed...
Patent number
5,814,554
Issue date
Sep 29, 1998
U.S. Philips Corporation
Mark A. De Samber
B81 - MICRO-STRUCTURAL TECHNOLOGY