Mark A. Kassab

Person

People

Patents Grantslast 30 patents

Information Patent Grant
Programmable test compactor for improving defect determination
- Patent number 11,320,487
- Issue date May 3, 2022
- SIEMENS INDUSTRY SOFTWARE INC.
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Layout-friendly test pattern decompressor
- Patent number 11,232,246
- Issue date Jan 25, 2022
- SIEMENS INDUSTRY SOFTWARE INC.
- Yu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Prediction of test pattern counts for scan configuration determination
- Patent number 11,010,523
- Issue date May 18, 2021
- SIEMENS INDUSTRY SOFTWARE INC.
- Yu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deterministic test pattern generation for designs with timing excep...
- Patent number 10,977,400
- Issue date Apr 13, 2021
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test scheduling and test access in test compression environment
- Patent number 10,955,460
- Issue date Mar 23, 2021
- Mentor Graphics Corporation
- Mark Kassab
- G01 - MEASURING TESTING
Information Patent Grant
Efficient and flexible network for streaming data in circuits
- Patent number 10,788,530
- Issue date Sep 29, 2020
- Mentor Graphics Corporation
- Jean-Francois Cote
- G01 - MEASURING TESTING
Information Patent Grant
Streaming networks efficiency using data throttling
- Patent number 10,775,436
- Issue date Sep 15, 2020
- Mentor Graphics Corporation
- Jean-Francois Cote
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timing-aware test generation and fault simulation
- Patent number 10,509,073
- Issue date Dec 17, 2019
- Mentor Graphics Corporation
- Xijiang Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data streaming for testing identical circuit blocks
- Patent number 10,473,721
- Issue date Nov 12, 2019
- Mentor Graphics Corporation
- Jean-Francois Cote
- G01 - MEASURING TESTING
Information Patent Grant
Data generation for streaming networks in circuits
- Patent number 10,476,740
- Issue date Nov 12, 2019
- Mentor Graphics Corporation
- Jean-Francois Cote
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Continuous application and decompression of test patterns and selec...
- Patent number 10,234,506
- Issue date Mar 19, 2019
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Multi-stage test response compactors
- Patent number 10,120,024
- Issue date Nov 6, 2018
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Channel sharing for testing circuits having non-identical cores
- Patent number 9,915,702
- Issue date Mar 13, 2018
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Multi-stage test response compactors
- Patent number 9,778,316
- Issue date Oct 3, 2017
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Timing-aware test generation and fault simulation
- Patent number 9,720,040
- Issue date Aug 1, 2017
- Mentor Graphics Corporation
- Xijiang Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Continuous application and decompression of test patterns and selec...
- Patent number 9,664,739
- Issue date May 30, 2017
- Mentor Graphics Corporation
- Janusz Rasjki
- G01 - MEASURING TESTING
Information Patent Grant
Isometric test compression with low toggling activity
- Patent number 9,651,622
- Issue date May 16, 2017
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic shift for test pattern compression
- Patent number 9,335,374
- Issue date May 10, 2016
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Continuous application and decompression of test patterns and selec...
- Patent number 9,134,370
- Issue date Sep 15, 2015
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Timing-aware test generation and fault simulation
- Patent number 9,086,454
- Issue date Jul 21, 2015
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Test scheduling with pattern-independent test access mechanism
- Patent number 9,088,522
- Issue date Jul 21, 2015
- Mentor Graphics Corporation
- Janusz Rajski
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test access mechanism for diagnosis based on partitioning scan chains
- Patent number 9,026,874
- Issue date May 5, 2015
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Scan test application through high-speed serial input/outputs
- Patent number 8,726,112
- Issue date May 13, 2014
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Test access mechanism for diagnosis based on partitioining scan chains
- Patent number 8,607,107
- Issue date Dec 10, 2013
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Timing-aware test generation and fault simulation
- Patent number 8,560,906
- Issue date Oct 15, 2013
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Continuous application and decompression of test patterns and selec...
- Patent number 8,533,547
- Issue date Sep 10, 2013
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
At-speed scan testing with controlled switching activity
- Patent number 8,499,209
- Issue date Jul 30, 2013
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Low power scan testing techniques and apparatus
- Patent number 8,290,738
- Issue date Oct 16, 2012
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for selectively compacting test responses
- Patent number 8,108,743
- Issue date Jan 31, 2012
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Timing-aware test generation and fault simulation
- Patent number 8,051,352
- Issue date Nov 1, 2011
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Layout-Friendly Test Pattern Decompressor
- Publication number 20210150112
- Publication date May 20, 2021
- Mentor Graphics Corporation
- Yu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINISTIC TEST PATTERN GENERATION FOR DESIGNS WITH TIMING EXCEP...
- Publication number 20200410065
- Publication date Dec 31, 2020
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-STAGE TEST RESPONSE COMPACTORS
- Publication number 20180156867
- Publication date Jun 7, 2018
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
TIMING-AWARE TEST GENERATION AND FAULT SIMULATION
- Publication number 20180045780
- Publication date Feb 15, 2018
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELEC...
- Publication number 20180017622
- Publication date Jan 18, 2018
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
MULTI-STAGE TEST RESPONSE COMPACTORS
- Publication number 20160320450
- Publication date Nov 3, 2016
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELEC...
- Publication number 20160003907
- Publication date Jan 7, 2016
- Mentor Graphics Corporation
- Janusz Rasjki
- G01 - MEASURING TESTING
Information Patent Application
TIMING-AWARE TEST GENERATION AND FAULT SIMULATION
- Publication number 20150323600
- Publication date Nov 12, 2015
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Application
Test Scheduling and Test Access in Test Compression Environment
- Publication number 20150285854
- Publication date Oct 8, 2015
- Mark A. Kassab
- G01 - MEASURING TESTING
Information Patent Application
Isometric Test Compression With Low Toggling Activity
- Publication number 20150253385
- Publication date Sep 10, 2015
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Shift For Test Pattern Compression
- Publication number 20150153410
- Publication date Jun 4, 2015
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Application
Channel Sharing For Testing Circuits Having Non-Identical Cores
- Publication number 20150149847
- Publication date May 28, 2015
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Application
TEST ACCESS MECHANISM FOR DIAGNOSIS BASED ON PARTITIONING SCAN CHAINS
- Publication number 20140101506
- Publication date Apr 10, 2014
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Application
TIMING-AWARE TEST GENERATION AND FAULT SIMULATION
- Publication number 20140047404
- Publication date Feb 13, 2014
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELEC...
- Publication number 20140006888
- Publication date Jan 2, 2014
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Test Scheduling With Pattern-Independent Test Access Mechanism
- Publication number 20130290795
- Publication date Oct 31, 2013
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
TIMING-AWARE TEST GENERATION AND FAULT SIMULATION
- Publication number 20120174049
- Publication date Jul 5, 2012
- Mentor Graphics Corporation
- Xijiang Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST ACCESS MECHANISM FOR DIAGNOSIS BASED ON PARTITIOINING SCAN CHAINS
- Publication number 20110258504
- Publication date Oct 20, 2011
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELEC...
- Publication number 20110214026
- Publication date Sep 1, 2011
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
DECOMPRESSOR/PRPG FOR APPLYING PSEUDO-RANDOM AND DETERMINISTIC TEST...
- Publication number 20110167309
- Publication date Jul 7, 2011
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER SCAN TESTING TECHNIQUES AND APPARATUS
- Publication number 20110166818
- Publication date Jul 7, 2011
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SELECTIVELY COMPACTING TEST RESPONSES
- Publication number 20110138242
- Publication date Jun 9, 2011
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Scan Test Application Through High-Speed Serial Input/Outputs
- Publication number 20100313089
- Publication date Dec 9, 2010
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
At-Speed Scan Testing With Controlled Switching Activity
- Publication number 20100275077
- Publication date Oct 28, 2010
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Cell-Aware Fault Model Creation And Pattern Generation
- Publication number 20100229061
- Publication date Sep 9, 2010
- Friedrich HAPKE
- G01 - MEASURING TESTING
Information Patent Application
GENERATING RESPONSES TO PATTERNS STIMULATING AN ELECTRONIC CIRCUIT...
- Publication number 20090327986
- Publication date Dec 31, 2009
- Dhiraj Goswami
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN COMPRESSION FOR AN INTEGRATED CIRCUIT TEST ENVIRONMENT
- Publication number 20090259900
- Publication date Oct 15, 2009
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SELECTIVELY COMPACTING TEST RESPONSES
- Publication number 20090228749
- Publication date Sep 10, 2009
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS TO A CIRC...
- Publication number 20090183041
- Publication date Jul 16, 2009
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
DECOMPRESSOR/PRPG FOR APPLYING PSEUDO-RANDOM AND DETERMINISTIC TEST...
- Publication number 20090177933
- Publication date Jul 9, 2009
- Janusz Rajski
- G01 - MEASURING TESTING

Mark A. Kassab

Person

Patents Grantslast 30 patents

Programmable test compactor for improving defect determination

Layout-friendly test pattern decompressor

Prediction of test pattern counts for scan configuration determination

Deterministic test pattern generation for designs with timing excep...

Test scheduling and test access in test compression environment

Efficient and flexible network for streaming data in circuits

Streaming networks efficiency using data throttling

Timing-aware test generation and fault simulation

Data streaming for testing identical circuit blocks

Data generation for streaming networks in circuits

Continuous application and decompression of test patterns and selec...

Multi-stage test response compactors

Channel sharing for testing circuits having non-identical cores

Multi-stage test response compactors

Timing-aware test generation and fault simulation

Continuous application and decompression of test patterns and selec...

Isometric test compression with low toggling activity

Dynamic shift for test pattern compression

Continuous application and decompression of test patterns and selec...

Timing-aware test generation and fault simulation

Test scheduling with pattern-independent test access mechanism

Test access mechanism for diagnosis based on partitioning scan chains

Scan test application through high-speed serial input/outputs

Test access mechanism for diagnosis based on partitioining scan chains

Timing-aware test generation and fault simulation

Continuous application and decompression of test patterns and selec...

At-speed scan testing with controlled switching activity

Low power scan testing techniques and apparatus

Method and apparatus for selectively compacting test responses

Timing-aware test generation and fault simulation

Patents Applicationslast 30 patents

Layout-Friendly Test Pattern Decompressor

DETERMINISTIC TEST PATTERN GENERATION FOR DESIGNS WITH TIMING EXCEP...

MULTI-STAGE TEST RESPONSE COMPACTORS

TIMING-AWARE TEST GENERATION AND FAULT SIMULATION

CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELEC...

MULTI-STAGE TEST RESPONSE COMPACTORS

CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELEC...

TIMING-AWARE TEST GENERATION AND FAULT SIMULATION

Test Scheduling and Test Access in Test Compression Environment

Isometric Test Compression With Low Toggling Activity

Dynamic Shift For Test Pattern Compression

Channel Sharing For Testing Circuits Having Non-Identical Cores

TEST ACCESS MECHANISM FOR DIAGNOSIS BASED ON PARTITIONING SCAN CHAINS

TIMING-AWARE TEST GENERATION AND FAULT SIMULATION

CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELEC...

Test Scheduling With Pattern-Independent Test Access Mechanism

TIMING-AWARE TEST GENERATION AND FAULT SIMULATION

TEST ACCESS MECHANISM FOR DIAGNOSIS BASED ON PARTITIOINING SCAN CHAINS

CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELEC...

DECOMPRESSOR/PRPG FOR APPLYING PSEUDO-RANDOM AND DETERMINISTIC TEST...

LOW POWER SCAN TESTING TECHNIQUES AND APPARATUS

METHOD AND APPARATUS FOR SELECTIVELY COMPACTING TEST RESPONSES

Scan Test Application Through High-Speed Serial Input/Outputs

At-Speed Scan Testing With Controlled Switching Activity

Cell-Aware Fault Model Creation And Pattern Generation

GENERATING RESPONSES TO PATTERNS STIMULATING AN ELECTRONIC CIRCUIT...

TEST PATTERN COMPRESSION FOR AN INTEGRATED CIRCUIT TEST ENVIRONMENT

METHOD AND APPARATUS FOR SELECTIVELY COMPACTING TEST RESPONSES

CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS TO A CIRC...

DECOMPRESSOR/PRPG FOR APPLYING PSEUDO-RANDOM AND DETERMINISTIC TEST...