Mark A. Meloni

Person

Flower Mound, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Laser ophthalmic treatment system with time-gated image capture com...
- Patent number 12,178,751
- Issue date Dec 31, 2024
- LUTRONIC VISION INC.
- Ezekiel Kruglick
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Polarization filtering for improved eye imaging
- Patent number 11,690,511
- Issue date Jul 4, 2023
- LUTRONIC VISION INC
- Seth Adrian Miller
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multimode configurable spectrometer
- Patent number 11,424,115
- Issue date Aug 23, 2022
- Verity Instruments, Inc.
- Larry Arlos Bullock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for measuring postlens tear film thickness
- Patent number 10,925,482
- Issue date Feb 23, 2021
- LUTRONIC VISION INC
- Seth Adrian Miller
- G01 - MEASURING TESTING
Information Patent Grant
Laser doppler vibrometry for eye surface vibration measurement to d...
- Patent number 10,925,767
- Issue date Feb 23, 2021
- LUTRONIC VISION INC
- Seth Adrian Miller
- G01 - MEASURING TESTING
Information Patent Grant
Microwave plasma source
- Patent number 10,923,324
- Issue date Feb 16, 2021
- Verity Instruments, Inc.
- Mark A. Meloni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fiberoptically-coupled measurement system with reduced sensitivity...
- Patent number 10,794,763
- Issue date Oct 6, 2020
- Verity Instruments, Inc.
- Mark A. Meloni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microwave plasma source
- Patent number 10,679,832
- Issue date Jun 9, 2020
- Verity Instruments, Inc.
- Mark A. Meloni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for calibration of optical signals in semiconduct...
- Patent number 10,365,212
- Issue date Jul 30, 2019
- Verity Instruments, Inc.
- Andrew Weeks Kueny
- G01 - MEASURING TESTING
Information Patent Grant
Arrayed imaging systems having improved alignment and associated me...
- Patent number 10,002,215
- Issue date Jun 19, 2018
- OmniVision Technologies, Inc.
- Edward R. Dowski
- B24 - GRINDING POLISHING
Information Patent Grant
High dynamic range measurement system for process monitoring
- Patent number 9,801,265
- Issue date Oct 24, 2017
- Verity Instruments, Inc.
- Larry Arlos Bullock
- G01 - MEASURING TESTING
Information Patent Grant
Referenced and stabilized optical measurement system
- Patent number 9,772,226
- Issue date Sep 26, 2017
- Verity Instruments, Inc.
- John Douglas Corless
- G01 - MEASURING TESTING
Information Patent Grant
Arrayed imaging systems having improved alignment and associated me...
- Patent number 9,418,193
- Issue date Aug 16, 2016
- OmniVision Technologies, Inc.
- Edward R. Dowski
- B24 - GRINDING POLISHING
Information Patent Grant
Workpiece characterization system
- Patent number 9,383,323
- Issue date Jul 5, 2016
- Verity Instruments, Inc.
- Mark Anthony Meloni
- G01 - MEASURING TESTING
Information Patent Grant
High dynamic range measurement system for process monitoring
- Patent number 9,310,250
- Issue date Apr 12, 2016
- Verity Instruments, Inc.
- Larry Arlos Bullock
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System to facilitate disassembly of components
- Patent number 9,266,201
- Issue date Feb 23, 2016
- EMPIRE TECHNOLOGY DEVELOPMENT LLC
- Ezekiel Kruglick
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Removing and segregating components from printed circuit boards
- Patent number 8,807,189
- Issue date Aug 19, 2014
- EMPIRE TECHNOLOGY DEVELOPMENT LLC
- Mark Meloni
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical alignment structures and associated methods
- Patent number 8,780,211
- Issue date Jul 15, 2014
- OmniVision Technologies, Inc.
- George C. Barnes
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Arrayed imaging systems having improved alignment and associated me...
- Patent number 8,599,301
- Issue date Dec 3, 2013
- OmniVision Technologies, Inc.
- Edward R. Dowski
- B24 - GRINDING POLISHING
Information Patent Grant
Tunable and switchable multilayer optical devices
- Patent number 8,582,115
- Issue date Nov 12, 2013
- OmniVision Technologies, Inc.
- Lu Gao
- G02 - OPTICS
Information Patent Grant
Disassembling an item by means of RF energy
- Patent number 8,572,831
- Issue date Nov 5, 2013
- EMPIRE TECHNOLOGY DEVELOPMENT LLC
- Ezekiel Kruglick
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical alignment structures and associated methods
- Patent number 8,477,195
- Issue date Jul 2, 2013
- OmniVision Technologies, Inc.
- George C. Barnes
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Removing and segregating components from printed circuit boards
- Patent number 8,366,874
- Issue date Feb 5, 2013
- EMPIRE TECHNOLOGY DEVELOPMENT LLC
- Mark Meloni
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Self referencing heterodyne reflectometer and method for implementing
- Patent number 7,589,843
- Issue date Sep 15, 2009
- Verity Instruments, Inc.
- Arun Ananth Aiyer
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne reflectometer for film thickness monitoring and method f...
- Patent number 7,339,682
- Issue date Mar 4, 2008
- Verity Instruments, Inc.
- Arun Ananth Aiyer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FIBEROPTICAL CABLE ASSEMBLIES AND INTERFACES FOR SPECTROMETERS
- Publication number 20230280560
- Publication date Sep 7, 2023
- Verity Instruments, Inc.
- Larry Bullock
- G02 - OPTICS
Information Patent Application
MULTIMODE CONFIGURABLE SPECTROMETER
- Publication number 20220406586
- Publication date Dec 22, 2022
- Verity Instruments, Inc.
- Larry Arlos Bullock
- G01 - MEASURING TESTING
Information Patent Application
LASER OPHTHALMIC TREATMENT SYSTEM WITH TIME-GATED IMAGE CAPTURE COM...
- Publication number 20210045915
- Publication date Feb 18, 2021
- Xinova, LLC
- Ezekiel KRUGLICK
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LASER DOPPLER VIBROMETRY FOR EYE SURFACE VIBRATION MEASUREMENT TO D...
- Publication number 20210000645
- Publication date Jan 7, 2021
- Xinova, LLC
- Seth Adrian MILLER
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
POLARIZATION FILTERING FOR IMPROVED EYE IMAGING
- Publication number 20200367746
- Publication date Nov 26, 2020
- Xinova, LLC
- Seth Adrian MILLER
- G02 - OPTICS
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING POSTLENS TEAR FILM THICKNESS
- Publication number 20200329960
- Publication date Oct 22, 2020
- Xinova, LLC
- Seth Adrian MILLER
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
FIBEROPTICALLY-COUPLED MEASUREMENT SYSTEM WITH REDUCED SENSITIVITY...
- Publication number 20200264044
- Publication date Aug 20, 2020
- Verity Instruments, Inc.
- Mark A. Meloni
- G01 - MEASURING TESTING
Information Patent Application
MICROWAVE PLASMA SOURCE
- Publication number 20190157045
- Publication date May 23, 2019
- Verity Instruments, Inc.
- Mark A. Meloni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROWAVE PLASMA SOURCE
- Publication number 20190013187
- Publication date Jan 10, 2019
- Verity Instruments, Inc.
- Mark A. Meloni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIMODE CONFIGURABLE SPECTROMETER
- Publication number 20180286650
- Publication date Oct 4, 2018
- Verity Instruments, Inc.
- Larry Arlos Bullock
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATION OF OPTICAL SIGNALS IN SEMICONDUCT...
- Publication number 20180136118
- Publication date May 17, 2018
- Verity Instruments, Inc.
- Andrew Weeks Kueny
- G01 - MEASURING TESTING
Information Patent Application
ARRAYED IMAGING SYSTEMS HAVING IMPROVED ALIGNMENT AND ASSOCIATED ME...
- Publication number 20160350445
- Publication date Dec 1, 2016
- Omnivision Technologies Inc.
- Edward R. Dowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH DYNAMIC RANGE MEASUREMENT SYSTEM FOR PROCESS MONITORING
- Publication number 20160316546
- Publication date Oct 27, 2016
- Verity Instruments, Inc.
- Larry Arlos Bullock
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Monitoring Pulsed Plasma Processes
- Publication number 20160131587
- Publication date May 12, 2016
- Verity Instruments, Inc.
- Mark Anthony Meloni
- G01 - MEASURING TESTING
Information Patent Application
ARRAYED IMAGING SYSTEMS HAVING IMPROVED ALIGNMENT AND ASSOCIATED ME...
- Publication number 20140220713
- Publication date Aug 7, 2014
- Omnivision Technologies Inc.
- Edward R. Dowski
- G02 - OPTICS
Information Patent Application
INDUCTIVELY REMOVABLE ASSEMBLY BONDING
- Publication number 20140026404
- Publication date Jan 30, 2014
- EMPIRE TECHNOLOGY DEVELOPMENT LLC
- EZEKIEL KRUGLICK
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Optical Alignment Structures And Associated Methods
- Publication number 20130294815
- Publication date Nov 7, 2013
- George C. Barnes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REMOVING AND SEGREGATING COMPONENTS FROM PRINTED CIRCUIT BOARDS
- Publication number 20130125364
- Publication date May 23, 2013
- EMPIRE TECHNOLOGY DEVELOPMENT LLC
- Mark Meloni
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and Apparatus for Measuring Process Parameters of a Plasma E...
- Publication number 20130016344
- Publication date Jan 17, 2013
- Larry Bullock
- G01 - MEASURING TESTING
Information Patent Application
REFERENCED AND STABILIZED OPTICAL MEASUREMENT SYSTEM
- Publication number 20130016343
- Publication date Jan 17, 2013
- John Douglas Corless
- G01 - MEASURING TESTING
Information Patent Application
In Situ Photoluminescence Characterization System and Method
- Publication number 20120326054
- Publication date Dec 27, 2012
- Mark Anthony Meloni
- G01 - MEASURING TESTING
Information Patent Application
Workpiece Characterization System
- Publication number 20120120387
- Publication date May 17, 2012
- Mark Anthony Meloni
- G01 - MEASURING TESTING
Information Patent Application
Tunable And Switchable Multilayer Optical Devices
- Publication number 20120086949
- Publication date Apr 12, 2012
- Lu Gao
- G02 - OPTICS
Information Patent Application
Removing and Segregating Components from Printed Circuit Boards
- Publication number 20120031566
- Publication date Feb 9, 2012
- EMPIRE TECHNOLOGY DEVELOPMENT LLC
- Mark Meloni
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Workpiece Characterization System
- Publication number 20120025097
- Publication date Feb 2, 2012
- Mark Anthony Meloni
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVELY REMOVABLE ASSEMBLY BONDING
- Publication number 20120011692
- Publication date Jan 19, 2012
- Ardent Research Corporation
- Ezekiel Kruglick
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Optical Alignment Structures And Associated Methods
- Publication number 20110310254
- Publication date Dec 22, 2011
- George C. Barnes, IV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Arrayed Imaging Systems And Associated Methods
- Publication number 20100165134
- Publication date Jul 1, 2010
- Edward R. Dowski, JR.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Heterodyne reflectomer for film thickness monitoring and method for...
- Publication number 20060192973
- Publication date Aug 31, 2006
- Verity Instruments, Inc.
- Arun Ananth Aiyer
- G01 - MEASURING TESTING

Mark A. Meloni

Person

Patents Grantslast 30 patents

Laser ophthalmic treatment system with time-gated image capture com...

Polarization filtering for improved eye imaging

Multimode configurable spectrometer

Systems and methods for measuring postlens tear film thickness

Laser doppler vibrometry for eye surface vibration measurement to d...

Microwave plasma source

Fiberoptically-coupled measurement system with reduced sensitivity...

Microwave plasma source

System and method for calibration of optical signals in semiconduct...

Arrayed imaging systems having improved alignment and associated me...

High dynamic range measurement system for process monitoring

Referenced and stabilized optical measurement system

Arrayed imaging systems having improved alignment and associated me...

Workpiece characterization system

High dynamic range measurement system for process monitoring

System to facilitate disassembly of components

Removing and segregating components from printed circuit boards

Optical alignment structures and associated methods

Arrayed imaging systems having improved alignment and associated me...

Tunable and switchable multilayer optical devices

Disassembling an item by means of RF energy

Optical alignment structures and associated methods

Removing and segregating components from printed circuit boards

Self referencing heterodyne reflectometer and method for implementing

Heterodyne reflectometer for film thickness monitoring and method f...

Patents Applicationslast 30 patents

FIBEROPTICAL CABLE ASSEMBLIES AND INTERFACES FOR SPECTROMETERS

MULTIMODE CONFIGURABLE SPECTROMETER

LASER OPHTHALMIC TREATMENT SYSTEM WITH TIME-GATED IMAGE CAPTURE COM...

LASER DOPPLER VIBROMETRY FOR EYE SURFACE VIBRATION MEASUREMENT TO D...

POLARIZATION FILTERING FOR IMPROVED EYE IMAGING

SYSTEMS AND METHODS FOR MEASURING POSTLENS TEAR FILM THICKNESS

FIBEROPTICALLY-COUPLED MEASUREMENT SYSTEM WITH REDUCED SENSITIVITY...

MICROWAVE PLASMA SOURCE

MICROWAVE PLASMA SOURCE

MULTIMODE CONFIGURABLE SPECTROMETER

SYSTEM AND METHOD FOR CALIBRATION OF OPTICAL SIGNALS IN SEMICONDUCT...

ARRAYED IMAGING SYSTEMS HAVING IMPROVED ALIGNMENT AND ASSOCIATED ME...

HIGH DYNAMIC RANGE MEASUREMENT SYSTEM FOR PROCESS MONITORING

Method and Apparatus for Monitoring Pulsed Plasma Processes

ARRAYED IMAGING SYSTEMS HAVING IMPROVED ALIGNMENT AND ASSOCIATED ME...

INDUCTIVELY REMOVABLE ASSEMBLY BONDING

Optical Alignment Structures And Associated Methods

REMOVING AND SEGREGATING COMPONENTS FROM PRINTED CIRCUIT BOARDS

Method and Apparatus for Measuring Process Parameters of a Plasma E...

REFERENCED AND STABILIZED OPTICAL MEASUREMENT SYSTEM

In Situ Photoluminescence Characterization System and Method

Workpiece Characterization System

Tunable And Switchable Multilayer Optical Devices

Removing and Segregating Components from Printed Circuit Boards

Workpiece Characterization System

INDUCTIVELY REMOVABLE ASSEMBLY BONDING

Optical Alignment Structures And Associated Methods

Arrayed Imaging Systems And Associated Methods

Heterodyne reflectomer for film thickness monitoring and method for...