Mark A. Thompson

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
FIB based open via analysis and repair
- Patent number 7,786,436
- Issue date Aug 31, 2010
- DCG Systems, Inc.
- Theodore R. Lundquist
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for integrated circuit backside navigation
- Patent number 7,135,123
- Issue date Nov 14, 2006
- Credence Systems Corporation
- Mark Alan Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for addressing thickness variations of a trenc...
- Patent number 7,115,426
- Issue date Oct 3, 2006
- Credence Systems Corporation
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for forming a cavity in a semiconductor substr...
- Patent number 6,855,622
- Issue date Feb 15, 2005
- NPTest, LLC
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FORMING A CONTACT TO SILICIDE AND A CONTACT TO...
- Publication number 20080090403
- Publication date Apr 17, 2008
- Credence Systems Corporation
- Rudolf Schlangen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for the improvement of material/voltage contrast
- Publication number 20070087572
- Publication date Apr 19, 2007
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for addressing thickness variations of a trenc...
- Publication number 20060030064
- Publication date Feb 9, 2006
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for forming a trench through a semiconductor s...
- Publication number 20030224601
- Publication date Dec 4, 2003
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS