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Mark A. Tverdy
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Boise, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Test sockets, test systems, and methods for testing microfeature de...
Patent number
7,256,595
Issue date
Aug 14, 2007
Micron Technology, Inc.
John L. Caldwell
G01 - MEASURING TESTING
Information
Patent Grant
Automated multi-chip module handler and testing system
Patent number
6,750,666
Issue date
Jun 15, 2004
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Grant
Automated multi-chip module handler and testing system
Patent number
6,483,333
Issue date
Nov 19, 2002
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Grant
Magazine for carrying a plurality of multi-chip modules
Patent number
6,414,503
Issue date
Jul 2, 2002
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Grant
Automated multi-chip module handler, method of module handling, and...
Patent number
6,356,094
Issue date
Mar 12, 2002
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Grant
Automated multi-chip module handler, method of module handling, and...
Patent number
6,229,323
Issue date
May 8, 2001
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method of controlling the environmental temperature n...
Patent number
5,903,163
Issue date
May 11, 1999
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Test sockets, test systems, and methods for testing microfeature de...
Publication number
20060197544
Publication date
Sep 7, 2006
Micron Technology, Inc.
John L. Caldwell
G01 - MEASURING TESTING
Information
Patent Application
Test sockets, test systems, and methods for testing microfeature de...
Publication number
20060197545
Publication date
Sep 7, 2006
Micron Technology, Inc.
John L. Caldwell
G01 - MEASURING TESTING
Information
Patent Application
Test sockets, test systems, and methods for testing microfeature de...
Publication number
20050206401
Publication date
Sep 22, 2005
John L. Caldwell
G01 - MEASURING TESTING
Information
Patent Application
Automated multi-chip module handler and testing system
Publication number
20030006793
Publication date
Jan 9, 2003
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED MULTI-CHIP MODULE HANDLER AND TESTING SYSTEM
Publication number
20020109517
Publication date
Aug 15, 2002
Mark A. Tverdy
G01 - MEASURING TESTING