Mark Andrew Couture

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Milton, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing integrated circuit chips
- Patent number 5,672,980
- Issue date Sep 30, 1997
- International Business Machines Corporation
- Richard Gordon Charlton
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing integrated circuit chips
- Patent number 5,659,256
- Issue date Aug 19, 1997
- International Business Machines Corporation
- Richard Gordon Charlton
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing integrated circuit chips
- Patent number 5,528,159
- Issue date Jun 18, 1996
- International Business Machine Corp.
- Richard G. Charlton
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing integrated circuit chips
- Patent number 5,523,696
- Issue date Jun 4, 1996
- International Business Machines Corp.
- Richard G. Charlton
- G01 - MEASURING TESTING