Mark B. Ketchen

Person

Hadley, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Circuits for converting SFQ-based RZ and NRZ signaling to bilevel v...
- Patent number 11,757,467
- Issue date Sep 12, 2023
- Northrop Grumman Systems Corporation
- Derek L. Knee
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Trilayer Josephson junction structure with small air bridge and no...
- Patent number 11,133,452
- Issue date Sep 28, 2021
- International Business Machines Corporation
- Josephine B. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trilayer Josephson junction structure with small air bridge and no...
- Patent number 10,381,542
- Issue date Aug 13, 2019
- International Business Machines Corporation
- Josephine B. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trilayer Josephson junction structure with small air bridge and no...
- Patent number 10,199,554
- Issue date Feb 5, 2019
- International Business Machines Corporation
- Josephine B. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single-flux-quantum probabilistic digitizer
- Patent number 9,793,913
- Issue date Oct 17, 2017
- International Business Machines Corporation
- John F. Bulzacchelli
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Single-flux-quantum probabilistic digitizer
- Patent number 9,614,532
- Issue date Apr 4, 2017
- International Business Machines Corporation
- John F. Bulzacchelli
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Trilayer josephson junction structure with small air bridge and no...
- Patent number 9,564,573
- Issue date Feb 7, 2017
- International Business Machines Corporation
- Josephine B. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modular array of fixed-coupling quantum systems for quantum informa...
- Patent number 9,379,303
- Issue date Jun 28, 2016
- GLOCBALFOUNDRIES INC.
- Jay M. Gambetta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Single level of metal test structure for differential timing and va...
- Patent number 9,194,909
- Issue date Nov 24, 2015
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Single level of metal test structure for differential timing and va...
- Patent number 9,075,109
- Issue date Jul 7, 2015
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid superconducting-magnetic memory cell and array
- Patent number 8,755,220
- Issue date Jun 17, 2014
- International Business Machines Corporation
- John F Bulzacchelli
- G11 - INFORMATION STORAGE
Information Patent Grant
Active 2-dimensional array structure for parallel testing
- Patent number 8,723,528
- Issue date May 13, 2014
- International Business Machines Corporation
- Mark B. Ketchen
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor devices having nanochannels confined by nanometer-spa...
- Patent number 8,691,608
- Issue date Apr 8, 2014
- International Business Machines Corporation
- Stefan Harrer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Array of quantum systems in a cavity for quantum computing
- Patent number 8,642,998
- Issue date Feb 4, 2014
- International Business Machines Corporation
- Jay M. Gambetta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor devices having nanochannels confined by nanometer-spa...
- Patent number 8,558,326
- Issue date Oct 15, 2013
- International Business Machines Corporation
- Stefan Harrer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Hybrid superconducting-magnetic memory cell and array
- Patent number 8,547,732
- Issue date Oct 1, 2013
- International Business Machines Corporation
- John F Bulzacchelli
- G11 - INFORMATION STORAGE
Information Patent Grant
High speed measurement of random variation/yield in integrated circ...
- Patent number 8,456,169
- Issue date Jun 4, 2013
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of partially depleted silicon-on-insulator CMOS circuit...
- Patent number 8,310,269
- Issue date Nov 13, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Acquisition of silicon-on-insulator switching history effects stati...
- Patent number 8,248,094
- Issue date Aug 21, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid superconducting-magnetic memory cell and array
- Patent number 8,208,288
- Issue date Jun 26, 2012
- International Business Machines Corporation
- John F. Bulzacchelli
- G11 - INFORMATION STORAGE
Information Patent Grant
Yield improvement for Josephson junction test device formation
- Patent number 8,188,752
- Issue date May 29, 2012
- International Business Machines Corporation
- Mark B. Ketchen
- G01 - MEASURING TESTING
Information Patent Grant
Single level of metal test structure for differential timing and va...
- Patent number 8,179,120
- Issue date May 15, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for determining a switching history time cons...
- Patent number 8,027,797
- Issue date Sep 27, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Test structure for resistive open detection using voltage contrast...
- Patent number 7,733,109
- Issue date Jun 8, 2010
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for inline variability measurement of integra...
- Patent number 7,595,654
- Issue date Sep 29, 2009
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for pulse generation used in characterizing e...
- Patent number 7,583,125
- Issue date Sep 1, 2009
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
M1 testable addressable array for device parameter characterization
- Patent number 7,512,509
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for inline measurement of switching delay his...
- Patent number 7,504,896
- Issue date Mar 17, 2009
- International Business Machines Corporation
- Manjul Bhushan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methods and apparatus for characterizing electronic fuses used to p...
- Patent number 7,504,875
- Issue date Mar 17, 2009
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for inline characterization of high speed ope...
- Patent number 7,355,902
- Issue date Apr 8, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CIRCUITS FOR CONVERTING SFQ-BASED RZ AND NRZ SIGNALING TO BILEVEL V...
- Publication number 20230046568
- Publication date Feb 16, 2023
- Northrop Grumman Systems Corporation
- Derek L. Knee
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TRILAYER JOSEPHSON JUNCTION STRUCTURE WITH SMALL AIR BRIDGE AND NO...
- Publication number 20200028064
- Publication date Jan 23, 2020
- International Business Machines Corporation
- Josephine B. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE-FLUX-QUANTUM PROBABILISTIC DIGITIZER
- Publication number 20170179973
- Publication date Jun 22, 2017
- International Business Machines Corporation
- John F. Bulzacchelli
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TRILAYER JOSEPHSON JUNCTION STRUCTURE WITH SMALL AIR BRIDGE AND NO...
- Publication number 20170084813
- Publication date Mar 23, 2017
- International Business Machines Corporation
- Josephine B. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRILAYER JOSEPHSON JUNCTION STRUCTURE WITH SMALL AIR BRIDGE AND NO...
- Publication number 20170077383
- Publication date Mar 16, 2017
- International Business Machines Corporation
- Josephine B. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRILAYER JOSEPHSON JUNCTION STRUCTURE WITH SMALL AIR BRIDGE AND NO...
- Publication number 20170033273
- Publication date Feb 2, 2017
- International Business Machines Corporation
- Josephine B. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID SUPERCONDUCTING-MAGNETIC MEMORY CELL AND ARRAY
- Publication number 20130303379
- Publication date Nov 14, 2013
- John F. BULZACCHELLI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICES HAVING NANOCHANNELS CONFINED BY NANOMETER-SPA...
- Publication number 20130288417
- Publication date Oct 31, 2013
- Stefan Harrer
- B82 - NANO-TECHNOLOGY
Information Patent Application
MODULAR ARRAY OF FIXED-COUPLING QUANTUM SYSTEMS FOR QUANTUM INFORMA...
- Publication number 20120326720
- Publication date Dec 27, 2012
- International Business Machines Corporation
- Jay M. Gambetta
- B82 - NANO-TECHNOLOGY
Information Patent Application
MODULAR ARRAY OF FIXED-COUPLING QUANTUM SYSTEMS FOR QUANTUM INFORMA...
- Publication number 20120319684
- Publication date Dec 20, 2012
- International Business Machines Corporation
- Jay M. Gambetta
- B82 - NANO-TECHNOLOGY
Information Patent Application
ARRAY OF QUANTUM SYSTEMS IN A CAVITY FOR QUANTUM COMPUTING
- Publication number 20120319085
- Publication date Dec 20, 2012
- International Business Machines Corporation
- Jay M. Gambetta
- B82 - NANO-TECHNOLOGY
Information Patent Application
ACTIVE 2-DIMENSIONAL ARRAY STRUCTURE FOR PARALLEL TESTING
- Publication number 20120286796
- Publication date Nov 15, 2012
- International Business Machines Corporation
- Mark B. Ketchen
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICES HAVING NANOCHANNELS CONFINED BY NANOMETER-SPA...
- Publication number 20120256281
- Publication date Oct 11, 2012
- International Business Machines Corporation
- Stefan Harrer
- B82 - NANO-TECHNOLOGY
Information Patent Application
TEST STRUCTURE FOR PARALLEL TEST IMPLEMENTED WITH ONE METAL LAYER
- Publication number 20120256651
- Publication date Oct 11, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...
- Publication number 20120166898
- Publication date Jun 28, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...
- Publication number 20120161807
- Publication date Jun 28, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
HYBRID SUPERCONDUCTING-MAGNETIC MEMORY CELL AND ARRAY
- Publication number 20120108434
- Publication date May 3, 2012
- International Business Machines Corporation
- JOHN F. BULZACCHELLI
- G11 - INFORMATION STORAGE
Information Patent Application
HIGH SPEED MEASUREMENT OF RANDOM VARIATION/YIELD IN INTEGRATED CIRC...
- Publication number 20110169499
- Publication date Jul 14, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...
- Publication number 20110043215
- Publication date Feb 24, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF PARTIALLY DEPLETED SILICON-ON-INSULATOR CMOS CIRCUIT...
- Publication number 20110043243
- Publication date Feb 24, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
ACQUISITION OF SILICON-ON-INSULATOR SWITCHING HISTORY EFFECTS STATI...
- Publication number 20110043242
- Publication date Feb 24, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Yield Improvement for Josephson Junction Test Device Formation
- Publication number 20110012619
- Publication date Jan 20, 2011
- International Business Machines Corporation
- Mark B. Ketchen
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Determining a Switching History Time Cons...
- Publication number 20090271134
- Publication date Oct 29, 2009
- Manjul Bhushan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HYBRID SUPERCONDUCTING-MAGNETIC MEMORY CELL AND ARRAY
- Publication number 20090244958
- Publication date Oct 1, 2009
- JOHN F. BULZACCHELLI
- G11 - INFORMATION STORAGE
Information Patent Application
TEST STRUCTURE AND METHOD FOR RESISTIVE OPEN DETECTION USING VOLTAG...
- Publication number 20090096461
- Publication date Apr 16, 2009
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Application
M1 Testable Addressable Array for Device Parameter Characterization
- Publication number 20080270064
- Publication date Oct 30, 2008
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Inline Variability Measurement of Integra...
- Publication number 20080142848
- Publication date Jun 19, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for inline measurement of switching delay his...
- Publication number 20080068099
- Publication date Mar 20, 2008
- Manjul Bhushan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Methods and Apparatus for Characterizing Electronic Fuses Used to P...
- Publication number 20080048638
- Publication date Feb 28, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Characterizing Electronic Fuses Used to P...
- Publication number 20080048761
- Publication date Feb 28, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING

Mark B. Ketchen

Person

Patents Grantslast 30 patents

Circuits for converting SFQ-based RZ and NRZ signaling to bilevel v...

Trilayer Josephson junction structure with small air bridge and no...

Trilayer Josephson junction structure with small air bridge and no...

Trilayer Josephson junction structure with small air bridge and no...

Single-flux-quantum probabilistic digitizer

Single-flux-quantum probabilistic digitizer

Trilayer josephson junction structure with small air bridge and no...

Modular array of fixed-coupling quantum systems for quantum informa...

Single level of metal test structure for differential timing and va...

Single level of metal test structure for differential timing and va...

Hybrid superconducting-magnetic memory cell and array

Active 2-dimensional array structure for parallel testing

Semiconductor devices having nanochannels confined by nanometer-spa...

Array of quantum systems in a cavity for quantum computing

Semiconductor devices having nanochannels confined by nanometer-spa...

Hybrid superconducting-magnetic memory cell and array

High speed measurement of random variation/yield in integrated circ...

Measurement of partially depleted silicon-on-insulator CMOS circuit...

Acquisition of silicon-on-insulator switching history effects stati...

Hybrid superconducting-magnetic memory cell and array

Yield improvement for Josephson junction test device formation

Single level of metal test structure for differential timing and va...

Methods and apparatus for determining a switching history time cons...

Test structure for resistive open detection using voltage contrast...

Methods and apparatus for inline variability measurement of integra...

Methods and apparatus for pulse generation used in characterizing e...

M1 testable addressable array for device parameter characterization

Methods and apparatus for inline measurement of switching delay his...

Methods and apparatus for characterizing electronic fuses used to p...

Methods and apparatus for inline characterization of high speed ope...

Patents Applicationslast 30 patents

CIRCUITS FOR CONVERTING SFQ-BASED RZ AND NRZ SIGNALING TO BILEVEL V...

TRILAYER JOSEPHSON JUNCTION STRUCTURE WITH SMALL AIR BRIDGE AND NO...

SINGLE-FLUX-QUANTUM PROBABILISTIC DIGITIZER

TRILAYER JOSEPHSON JUNCTION STRUCTURE WITH SMALL AIR BRIDGE AND NO...

TRILAYER JOSEPHSON JUNCTION STRUCTURE WITH SMALL AIR BRIDGE AND NO...

TRILAYER JOSEPHSON JUNCTION STRUCTURE WITH SMALL AIR BRIDGE AND NO...

HYBRID SUPERCONDUCTING-MAGNETIC MEMORY CELL AND ARRAY

SEMICONDUCTOR DEVICES HAVING NANOCHANNELS CONFINED BY NANOMETER-SPA...

MODULAR ARRAY OF FIXED-COUPLING QUANTUM SYSTEMS FOR QUANTUM INFORMA...

MODULAR ARRAY OF FIXED-COUPLING QUANTUM SYSTEMS FOR QUANTUM INFORMA...

ARRAY OF QUANTUM SYSTEMS IN A CAVITY FOR QUANTUM COMPUTING

ACTIVE 2-DIMENSIONAL ARRAY STRUCTURE FOR PARALLEL TESTING

SEMICONDUCTOR DEVICES HAVING NANOCHANNELS CONFINED BY NANOMETER-SPA...

TEST STRUCTURE FOR PARALLEL TEST IMPLEMENTED WITH ONE METAL LAYER

SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...

SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...

HYBRID SUPERCONDUCTING-MAGNETIC MEMORY CELL AND ARRAY

HIGH SPEED MEASUREMENT OF RANDOM VARIATION/YIELD IN INTEGRATED CIRC...

SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...

MEASUREMENT OF PARTIALLY DEPLETED SILICON-ON-INSULATOR CMOS CIRCUIT...

ACQUISITION OF SILICON-ON-INSULATOR SWITCHING HISTORY EFFECTS STATI...

Yield Improvement for Josephson Junction Test Device Formation

Methods and Apparatus for Determining a Switching History Time Cons...

HYBRID SUPERCONDUCTING-MAGNETIC MEMORY CELL AND ARRAY

TEST STRUCTURE AND METHOD FOR RESISTIVE OPEN DETECTION USING VOLTAG...

M1 Testable Addressable Array for Device Parameter Characterization

Methods and Apparatus for Inline Variability Measurement of Integra...

Methods and apparatus for inline measurement of switching delay his...

Methods and Apparatus for Characterizing Electronic Fuses Used to P...

Methods and Apparatus for Characterizing Electronic Fuses Used to P...