Mark Boehm

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Wylie, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Control of implant pattern critical dimensions using STI step heigh...
- Patent number 8,530,247
- Issue date Sep 10, 2013
- Texas Instruments Incorporated
- Brian Douglas Reid
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONTROL OF IMPLANT CRITICAL DIMENSIONS USING AN STI STEP HEIGHT BAS...
- Publication number 20090170222
- Publication date Jul 2, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Brian Douglas Reid
- H01 - BASIC ELECTRIC ELEMENTS