Mark Boike

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Test wrapper including integrated scan chain for testing embedded h...
- Patent number 7,607,057
- Issue date Oct 20, 2009
- LSI Corporation
- Mark Allen Boike
- G01 - MEASURING TESTING
Information Patent Grant
In-circuit emulation debugger and method of operation thereof
- Patent number 7,360,117
- Issue date Apr 15, 2008
- VeriSilicon Holdings (Cayman Islands) Co. Ltd.
- Mark A. Boike
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit containing multiple digital signal processors
- Patent number 6,959,376
- Issue date Oct 25, 2005
- LSI Logic Corporation
- Mark Boike
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for a host processor to broadcast data to instruc...
- Patent number 6,845,412
- Issue date Jan 18, 2005
- LSI Logic Corporation
- Mark A. Boike
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Efficient memory management mechanism for digital signal processor...
- Patent number 6,715,038
- Issue date Mar 30, 2004
- LSI Logic Corporation
- Hung T. Nguyen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Test wrapper including integrated scan chain for testing embedded h...
- Publication number 20060156100
- Publication date Jul 13, 2006
- Mark Allen Boike
- G01 - MEASURING TESTING
Information Patent Application
Processor implementing conditional execution and including a serial...
- Publication number 20060031662
- Publication date Feb 9, 2006
- LSI Logic Corporation
- Hung Nguyen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for real-time tracing and profiling of a supersca...
- Publication number 20040064685
- Publication date Apr 1, 2004
- Hung Nguyen
- G06 - COMPUTING CALCULATING COUNTING