Mark Borowicz

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for measuring a characteristic of a substrate o...
- Patent number 8,765,496
- Issue date Jul 1, 2014
- KLA-Tencor Technologies Corp.
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Grant
Charge-control method and apparatus for electron beam imaging
- Patent number 7,488,938
- Issue date Feb 10, 2009
- KLA-Tencor Technologies Corporation
- Alexander Jozef Gubbens
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for measuring a characteristic of a substrate o...
- Patent number 7,365,321
- Issue date Apr 29, 2008
- KLA-Tencor Technologies Corp.
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Grant
Systems configured to reduce distortion of a resist during a metrol...
- Patent number 7,304,302
- Issue date Dec 4, 2007
- KLA-Tencor Technologies Corp.
- Peter Nunan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods and Systems for Measuring a Characteristic of a Substrate o...
- Publication number 20140291516
- Publication date Oct 2, 2014
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING A CHARACTERISTIC OF A SUBSTRATE O...
- Publication number 20080264905
- Publication date Oct 30, 2008
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for measuring a characteristic of a substrate o...
- Publication number 20050221229
- Publication date Oct 6, 2005
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING