Mark Burns

Person

McKinney, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Parallel integrated circuit test apparatus and test method
- Patent number 6,897,670
- Issue date May 24, 2005
- Texas Instruments Incorporated
- Mark A. Burns
- G01 - MEASURING TESTING
Information Patent Grant
Signal clipping circuit
- Patent number 6,750,694
- Issue date Jun 15, 2004
- Texas Instruments Incorporated
- Mark A. Burns
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Capture and conversion of mixed-signal test stimuli
- Patent number 6,691,077
- Issue date Feb 10, 2004
- Texas Instruments Incorporated
- Mark Burns
- G01 - MEASURING TESTING
Information Patent Grant
Design-for-test circuit for successive approximation analog-to-digi...
- Patent number 6,567,021
- Issue date May 20, 2003
- Texas Instruments Incorporated
- Mark A. Burns
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Piecewise linear digital to analog conversion
- Patent number 6,445,325
- Issue date Sep 3, 2002
- Texas Instruments Incorporated
- Mark A. Burns
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus to measure non-coherent signals
- Patent number 6,292,760
- Issue date Sep 18, 2001
- Texas Instruments Incorporated
- Mark Burns
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to measure jitter.
- Patent number 6,240,130
- Issue date May 29, 2001
- Texas Instruments Incorporated
- Mark Burns
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus to generate mixed signal test stimulus
- Patent number 6,184,810
- Issue date Feb 6, 2001
- Texas Instruments Incorporated
- Mark A. Burns
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Undersampling digital testability circuit
- Patent number 5,825,786
- Issue date Oct 20, 1998
- Texas Instruments Incorporated
- Mark Burns
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coherent undersampling digitizer for use with automatic field test...
- Patent number 5,589,763
- Issue date Dec 31, 1996
- Texas Instruments Incorporated
- Mark A. Burns
- G01 - MEASURING TESTING
Information Patent Grant
Undersampling digitizer with a sampling circuit positioned on an in...
- Patent number 5,578,935
- Issue date Nov 26, 1996
- Texas Instruments Incorporated
- Mark A. Burns
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of eliminating interference in an undersettled...
- Patent number 5,511,010
- Issue date Apr 23, 1996
- Texas Instruments Incorporated
- Mark A. Burns
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Parallel integrated circuit test apparatus and test method
- Publication number 20030117161
- Publication date Jun 26, 2003
- Mark A. Burns
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Parallel integrated circuit test apparatus and test method

Signal clipping circuit

Capture and conversion of mixed-signal test stimuli

Design-for-test circuit for successive approximation analog-to-digi...

Piecewise linear digital to analog conversion

Method and apparatus to measure non-coherent signals

Method and apparatus to measure jitter.

Method and apparatus to generate mixed signal test stimulus

Undersampling digital testability circuit

Coherent undersampling digitizer for use with automatic field test...

Undersampling digitizer with a sampling circuit positioned on an in...

Method and apparatus of eliminating interference in an undersettled...

Patents Applicationslast 30 patents

Parallel integrated circuit test apparatus and test method