Mark D. Heerema

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Santa Rosa, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for providing signal analysis data
- Patent number 8,860,400
- Issue date Oct 14, 2014
- Agilent Technologies, Inc.
- Mark D. Heerema
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-tuneable filter calibration
- Patent number 4,858,159
- Issue date Aug 15, 1989
- Hewlett-Packard Company
- Lynn M. Wheelwright
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR PROVIDING SIGNAL ANALYSIS DATA
- Publication number 20090085555
- Publication date Apr 2, 2009
- Mark D. Heerema
- G01 - MEASURING TESTING