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Mark David Minich
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Lafayette, IN, US
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Patents Grants
last 30 patents
Information
Patent Grant
Electric meter contact arc detector employing dual-purposed inducti...
Patent number
10,816,580
Issue date
Oct 27, 2020
Landis+Gyr LLC
Mark David Minich
G01 - MEASURING TESTING
Information
Patent Grant
Detection of deteriorated electrical connections in a meter using t...
Patent number
10,788,542
Issue date
Sep 29, 2020
Landis+Gyr LLC
Mark David Minich
G01 - MEASURING TESTING
Information
Patent Grant
Detection of deteriorated electrical connections in a meter using a...
Patent number
10,527,704
Issue date
Jan 7, 2020
Landis+Gyr LLC
Mark David Minich
G01 - MEASURING TESTING
Information
Patent Grant
Detection of deteriorated electrical connections in a meter using t...
Patent number
10,393,791
Issue date
Aug 27, 2019
Landis+Gyr LLC
Mark David Minich
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETECTION OF DETERIORATED ELECTRICAL CONNECTIONS IN A METER USING T...
Publication number
20190391198
Publication date
Dec 26, 2019
Mark David Minich
G01 - MEASURING TESTING
Information
Patent Application
Electric Meter Contact Arc Detector Employing Dual-Purposed Inducti...
Publication number
20190227105
Publication date
Jul 25, 2019
Landis+Gyr LLC
Mark David Minich
G01 - MEASURING TESTING
Information
Patent Application
DETECTION OF DETERIORATED ELECTRICAL CONNECTIONS IN A METER USING T...
Publication number
20190094285
Publication date
Mar 28, 2019
Mark David Minich
G01 - MEASURING TESTING
Information
Patent Application
DETECTION OF DETERIORATED ELECTRICAL CONNECTIONS IN A METER USING A...
Publication number
20190094329
Publication date
Mar 28, 2019
Mark David Minich
G01 - MEASURING TESTING