Mark Deome

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern correction circuit
- Patent number 7,512,857
- Issue date Mar 31, 2009
- LTX Corporation
- Warren Necoechea
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single platform electronic tester
- Patent number 7,191,368
- Issue date Mar 13, 2007
- LTX Corporation
- Donald V. Organ
- G01 - MEASURING TESTING
Information Patent Grant
Single platform electronic tester
- Patent number 7,092,837
- Issue date Aug 15, 2006
- LTX Corporation
- Kenneth J. Lanier
- G11 - INFORMATION STORAGE
Information Patent Grant
System for and method of performing device-oriented tests
- Patent number 6,768,960
- Issue date Jul 27, 2004
- LTX Corporation
- Don Organ
- G01 - MEASURING TESTING
Information Patent Grant
Separating device response signals from composite signals
- Patent number 6,703,825
- Issue date Mar 9, 2004
- LTX Corporation
- William R. Creek
- G01 - MEASURING TESTING
Information Patent Grant
Single platform electronic tester
- Patent number 6,675,339
- Issue date Jan 6, 2004
- LTX Corporation
- Kenneth J. Lanier
- G01 - MEASURING TESTING
Information Patent Grant
Separating device response signals from composite signals
- Patent number 6,563,298
- Issue date May 13, 2003
- LTX Corporation
- William R. Creek
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for distributed test pattern decompression
- Patent number 6,560,756
- Issue date May 6, 2003
- LTX Corporation
- R. Warren Necoechea
- G01 - MEASURING TESTING
Information Patent Grant
Generating and controlling analog and digital signals on a mixed si...
- Patent number 6,512,989
- Issue date Jan 28, 2003
- LTX Corporation
- Mark Deome
- G01 - MEASURING TESTING
Information Patent Grant
Single platform electronic tester
- Patent number 6,449,741
- Issue date Sep 10, 2002
- LTX Corporation
- Donald V. Organ
- G01 - MEASURING TESTING
Information Patent Grant
Capturing and displaying computer program execution timing
- Patent number 6,332,212
- Issue date Dec 18, 2001
- LTX Corporation
- Donald V. Organ
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System for and method of performing device-oriented tests
- Publication number 20020177968
- Publication date Nov 28, 2002
- Don Organ
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Pattern correction circuit

Single platform electronic tester

Single platform electronic tester

System for and method of performing device-oriented tests

Separating device response signals from composite signals

Single platform electronic tester

Separating device response signals from composite signals

Method and apparatus for distributed test pattern decompression

Generating and controlling analog and digital signals on a mixed si...

Single platform electronic tester

Capturing and displaying computer program execution timing

Patents Applicationslast 30 patents

System for and method of performing device-oriented tests