Mark Donahue

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Malden, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for ion beam angle measurement in two dimensions
- Patent number 7,394,073
- Issue date Jul 1, 2008
- Varian Semiconductor Equipment Associates, Inc.
- James J. Cummings
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods & apparatus for ion beam angle measurement in two dimensions
- Publication number 20060289798
- Publication date Dec 28, 2006
- Varian Semiconductor Equipment Associates, Inc.
- James J. Cummings
- G01 - MEASURING TESTING