Mark E. Lagus

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Stanfordville, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Monitoring a process sector in a production facility
- Patent number 8,340,800
- Issue date Dec 25, 2012
- International Business Machines Corporation
- William Cote
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for fabricating a scanning probe microscope probe
- Patent number 6,656,369
- Issue date Dec 2, 2003
- International Business Machines Corporation
- Mahadevaiyer Krishnan
- G01 - MEASURING TESTING
Information Patent Grant
Etching parameter control system process
- Patent number 6,004,706
- Issue date Dec 21, 1999
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for critical dimension and tool resolution det...
- Patent number 5,969,273
- Issue date Oct 19, 1999
- International Business Machines Corporation
- Charles N. Archie
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Focus or exposure dose parameter control system using tone reversin...
- Patent number 5,965,309
- Issue date Oct 12, 1999
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MONITORING A PROCESS SECTOR IN A PRODUCTION FACILITY
- Publication number 20100017010
- Publication date Jan 21, 2010
- International Business Machines Corporation
- William Cote
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for fabricating a scanning probe microscope probe
- Publication number 20030132191
- Publication date Jul 17, 2003
- International Business Machines Corporation
- Mahadevaiyer Krishnan
- G01 - MEASURING TESTING