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Mark E. Secrest
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Vancouver, WA, US
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for orienting a crystalline body during radiat...
Patent number
6,760,403
Issue date
Jul 6, 2004
SEH America, Inc.
Richard M. Aydelott
G01 - MEASURING TESTING
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Patent Grant
Method for identifying desired features in a crystal
Patent number
6,055,293
Issue date
Apr 25, 2000
SEH America, Inc.
Mark Edward Secrest
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for locating an alignment feature of a crystalline body
Publication number
20040213376
Publication date
Oct 28, 2004
SEH America, Inc.
Richard M. Aydelott
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for orienting a crystalline body during radiat...
Publication number
20030081723
Publication date
May 1, 2003
SEH America, Inc.
Richard M. Aydelott
G01 - MEASURING TESTING