Mark Edward Hamberger

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Bay Shore, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of detecting and compensating for faults in an MRI process
- Patent number 7,557,572
- Issue date Jul 7, 2009
- Fonar Corporation
- David Hertz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS, ELECTRICAL POWER CONTROL SYSTEM, AND POWER CONTROL CIRCUIT...
- Publication number 20140209803
- Publication date Jul 31, 2014
- FTRX LLC
- Mark Edward Hamberger
- G01 - MEASURING TESTING