Mark Elston

Person

Salinas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Implementing edit and update functionality within a development env...
- Patent number 9,785,542
- Issue date Oct 10, 2017
- Advantest Corporation
- Mark Elston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated generation of a test class pre-header from an interactive...
- Patent number 9,785,526
- Issue date Oct 10, 2017
- Advantest Corporation
- Mark Elston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using shared pins in a concurrent test execution environment
- Patent number 9,274,911
- Issue date Mar 1, 2016
- Advantest Corporation
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure to develop a test program for semiconductor in...
- Patent number 8,255,198
- Issue date Aug 28, 2012
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING
Information Patent Grant
Compact representation of vendor hardware module revisions in an op...
- Patent number 8,214,800
- Issue date Jul 3, 2012
- Advantest Corporation
- Ankan Pramanick
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for performing installation and configuration man...
- Patent number 8,082,541
- Issue date Dec 20, 2011
- Advantest Corporation
- Ankan Pramanick
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for scheduling tests in a parallel test system
- Patent number 7,543,200
- Issue date Jun 2, 2009
- Advantest Corporation
- Ankan Pramanick
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing integrated circuits
- Patent number 7,437,261
- Issue date Oct 14, 2008
- Advantest Corporation
- Ankan Pramanick
- G01 - MEASURING TESTING
Information Patent Grant
Datalog support in a modular test system
- Patent number 7,430,486
- Issue date Sep 30, 2008
- Advantest America R&D Center, Inc.
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure to develop a test program for semiconductor in...
- Patent number 7,209,851
- Issue date Apr 24, 2007
- Advantest America R&D Center, Inc.
- Harsanjeet Singh
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for simulating a modular test system
- Patent number 7,210,087
- Issue date Apr 24, 2007
- Advantest America R&D Center, Inc.
- Conrad Mukai
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure to develop a test program for semiconductor in...
- Patent number 7,197,417
- Issue date Mar 27, 2007
- Advantest America R&D Center, Inc.
- Ankan Pramanick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Supporting calibration and diagnostics in an open architecture test...
- Patent number 7,197,416
- Issue date Mar 27, 2007
- Advantest America R&D Center, Inc.
- Toshiaki Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for controlling interchangeable components in a m...
- Patent number 7,184,917
- Issue date Feb 27, 2007
- Advantest America R&D Center, Inc.
- Ankan Pramanick
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED GENERATION OF A TEST CLASS PRE-HEADER FROM AN INTERACTIVE...
- Publication number 20140324378
- Publication date Oct 30, 2014
- Advantest Corporation
- Mark ELSTON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPLEMENTING EDIT AND UPDATE FUNCTIONALITY WITHIN A DEVELOPMENT ENV...
- Publication number 20140310693
- Publication date Oct 16, 2014
- Advantest Corporation
- Mark ELSTON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING SHARED PINS IN A CONCURRENT TEST EXECUTION ENVIRONMENT
- Publication number 20140237291
- Publication date Aug 21, 2014
- Advantest Corporation
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Application
Method and Structure to Develop a Test Program for Semiconductor In...
- Publication number 20100192135
- Publication date Jul 29, 2010
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING
Information Patent Application
Compact representation of vendor hardware module revisions in an op...
- Publication number 20060200816
- Publication date Sep 7, 2006
- Advantest America R&D Center, Inc.
- Ankan Pramanick
- G01 - MEASURING TESTING
Information Patent Application
Method and system for scheduling tests in a parallel test system
- Publication number 20060195747
- Publication date Aug 31, 2006
- Ankan Pramanick
- G01 - MEASURING TESTING
Information Patent Application
Method and system for performing installation and configuration man...
- Publication number 20060130041
- Publication date Jun 15, 2006
- Advantest Corporation
- Ankan Pramanick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Supporting calibration and diagnostics in an open architecture test...
- Publication number 20050261855
- Publication date Nov 24, 2005
- Advantest America R&D Center, Inc.
- Toshiaki Adachi
- G01 - MEASURING TESTING
Information Patent Application
Method and system for simulating a modular test system
- Publication number 20050262412
- Publication date Nov 24, 2005
- Advantest America R&D Center, Inc.
- Conrad Mukai
- G01 - MEASURING TESTING
Information Patent Application
Datalog support in a modular test system
- Publication number 20050262414
- Publication date Nov 24, 2005
- Advantest America R&D Center, Inc.
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Application
Method and structure to develop a test program for semiconductor in...
- Publication number 20050154550
- Publication date Jul 14, 2005
- Advantest America R&D Center, Inc.
- Harsanjeet Singh
- G01 - MEASURING TESTING
Information Patent Application
Method and structure to develop a test program for semiconductor in...
- Publication number 20050154551
- Publication date Jul 14, 2005
- Advantest Corporation
- Ankan Pramanick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for controlling interchangeable components in a m...
- Publication number 20050022087
- Publication date Jan 27, 2005
- Ankan Pramanick
- G01 - MEASURING TESTING
Information Patent Application
Method and structure to develop a test program for semiconductor in...
- Publication number 20040225459
- Publication date Nov 11, 2004
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing integrated circuits
- Publication number 20040225465
- Publication date Nov 11, 2004
- Advantest Corporation
- Ankan Pramanick
- G01 - MEASURING TESTING

Mark Elston

Person

Patents Grantslast 30 patents

Implementing edit and update functionality within a development env...

Automated generation of a test class pre-header from an interactive...

Using shared pins in a concurrent test execution environment

Method and structure to develop a test program for semiconductor in...

Compact representation of vendor hardware module revisions in an op...

Method and system for performing installation and configuration man...

Method and system for scheduling tests in a parallel test system

Method and apparatus for testing integrated circuits

Datalog support in a modular test system

Method and structure to develop a test program for semiconductor in...

Method and system for simulating a modular test system

Method and structure to develop a test program for semiconductor in...

Supporting calibration and diagnostics in an open architecture test...

Method and system for controlling interchangeable components in a m...

Patents Applicationslast 30 patents

AUTOMATED GENERATION OF A TEST CLASS PRE-HEADER FROM AN INTERACTIVE...

IMPLEMENTING EDIT AND UPDATE FUNCTIONALITY WITHIN A DEVELOPMENT ENV...

USING SHARED PINS IN A CONCURRENT TEST EXECUTION ENVIRONMENT

Method and Structure to Develop a Test Program for Semiconductor In...

Compact representation of vendor hardware module revisions in an op...

Method and system for scheduling tests in a parallel test system

Method and system for performing installation and configuration man...

Supporting calibration and diagnostics in an open architecture test...

Method and system for simulating a modular test system

Datalog support in a modular test system

Method and structure to develop a test program for semiconductor in...

Method and structure to develop a test program for semiconductor in...

Method and system for controlling interchangeable components in a m...

Method and structure to develop a test program for semiconductor in...

Method and apparatus for testing integrated circuits