Mark Feldman

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Redmond, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Variable focal length constant magnification lens assembly
- Patent number 7,436,587
- Issue date Oct 14, 2008
- Mitutoyo Corporation
- Mark Feldman
- G02 - OPTICS
Information Patent Grant
Detector configuration for interferometric distance measurement
- Patent number 7,379,187
- Issue date May 27, 2008
- Mitutoyo Corporation
- Mark Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Monolithic quadrature detector
- Patent number 7,315,381
- Issue date Jan 1, 2008
- Mitutoyo Corporation
- David W. Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength detector
- Patent number 7,253,902
- Issue date Aug 7, 2007
- Mitutoyo Corporation
- Mark Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Multimode electronic calipers having ratiometric mode and simplifie...
- Patent number 7,246,032
- Issue date Jul 17, 2007
- Mitutoyo Corporation
- Mark Feldman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Detector configuration for interferometric distance measurement
- Publication number 20070229841
- Publication date Oct 4, 2007
- Mitutoyo Corporation
- Mark Feldman
- G01 - MEASURING TESTING
Information Patent Application
Variable focal length constant magnification lens assembly
- Publication number 20070221821
- Publication date Sep 27, 2007
- MICRO ENCODER INC.
- Mark Feldman
- G02 - OPTICS
Information Patent Application
Multimode electronic calipers having ratiometric mode and simplifie...
- Publication number 20070055475
- Publication date Mar 8, 2007
- Mitutoyo Corporation
- Mark Feldman
- G01 - MEASURING TESTING
Information Patent Application
Multimode electronic calipers having ratiometric mode and simplifie...
- Publication number 20060106568
- Publication date May 18, 2006
- Mark Feldman
- G01 - MEASURING TESTING
Information Patent Application
Monolithic quadrature detector
- Publication number 20060087658
- Publication date Apr 27, 2006
- Mitutoyo Corporation
- David W. Sesko
- G01 - MEASURING TESTING
Information Patent Application
Wavelength detector
- Publication number 20050219536
- Publication date Oct 6, 2005
- Mark Feldman
- G01 - MEASURING TESTING