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Mark Forde

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  • Nenagh, IE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device configured for gate dielectric monitoring
    • Patent number 12,032,014
    • Issue date Jul 9, 2024
    • Analog Devices International Unlimited Company
    • Edward John Coyne
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Exposure monitor device
    • Patent number 11,988,708
    • Issue date May 21, 2024
    • Analog Devices International Unlimited Company
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Exposure monitor device
    • Patent number 11,686,763
    • Issue date Jun 27, 2023
    • Analog Devices International Unlimited Company
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Exposure monitor device
    • Patent number 11,269,006
    • Issue date Mar 8, 2022
    • Analog Devices International Unlimited Company
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wear-out monitor device
    • Patent number 10,794,950
    • Issue date Oct 6, 2020
    • Analog Devices Global
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wear-out monitor device
    • Patent number 10,365,322
    • Issue date Jul 30, 2019
    • Analog Devices Global
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wear-out monitor device
    • Patent number 10,338,132
    • Issue date Jul 2, 2019
    • Analog Devices Global
    • Edward John Coyne
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    LIFETIME INDICATOR SYSTEM
    • Publication number 20240377453
    • Publication date Nov 14, 2024
    • Analog Devices International Unlimited Company
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Application

    EXPOSURE MONITOR DEVICE
    • Publication number 20230366924
    • Publication date Nov 16, 2023
    • Analog Devices International Unlimited Company
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Application

    EXPOSURE MONITOR DEVICE
    • Publication number 20220252664
    • Publication date Aug 11, 2022
    • Analog Devices International Unlimited Company
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Application

    WEAR-OUT MONITOR DEVICE
    • Publication number 20210088580
    • Publication date Mar 25, 2021
    • ANALOG DEVICES GLOBAL
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE CONFIGURED FOR GATE DIELECTRIC MONITORING
    • Publication number 20210072304
    • Publication date Mar 11, 2021
    • Analog Devices International Unlimited Company
    • Edward John Coyne
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    WEAR-OUT MONITOR DEVICE
    • Publication number 20190361071
    • Publication date Nov 28, 2019
    • ANALOG DEVICES GLOBAL
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Application

    WEAR-OUT MONITOR DEVICE
    • Publication number 20170299649
    • Publication date Oct 19, 2017
    • ANALOG DEVICES GLOBAL
    • Edward John Coyne
    • G01 - MEASURING TESTING
  • Information Patent Application

    WEAR-OUT MONITOR DEVICE
    • Publication number 20170299650
    • Publication date Oct 19, 2017
    • ANALOG DEVICES GLOBAL
    • Edward John Coyne
    • G01 - MEASURING TESTING