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Mark Geshel
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Kfar-Saba, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and systems for sequence calling
Patent number
11,462,300
Issue date
Oct 4, 2022
ULTIMA GENOMICS, INC.
Avishai Bartov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of examining locations in a wafer with adjustable navigation...
Patent number
10,663,407
Issue date
May 26, 2020
Applied Materials Israel Ltd.
Idan Kaizerman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of generating an examination recipe and system thereof
Patent number
10,290,087
Issue date
May 14, 2019
Applied Materials Israel Ltd.
Ariel Shkalim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of examining locations in a wafer with adjustable navigation...
Patent number
10,161,882
Issue date
Dec 25, 2018
Applied Materials Israel Ltd.
Idan Kaizerman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of design-based defect classification and system thereof
Patent number
9,401,013
Issue date
Jul 26, 2016
Applied Materials Israel, Ltd.
Mark Geshel
G01 - MEASURING TESTING
Information
Patent Grant
Method of generating a recipe for a manufacturing tool and system t...
Patent number
8,640,060
Issue date
Jan 28, 2014
Applied Materials Israel, Ltd.
Mark Geshel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
BARCODE SELECTION
Publication number
20240274237
Publication date
Aug 15, 2024
Ultima Genomics, Inc.
Yoav ETZIONI
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHODS AND SYSTEMS FOR SEQUENCE CALLING
Publication number
20230197197
Publication date
Jun 22, 2023
Ultima Genomics, Inc.
Avishai Bartov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND SYSTEMS FOR SEQUENCE CALLING
Publication number
20210366576
Publication date
Nov 25, 2021
Ultima Genomics, Inc.
Avishai Bartov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF EXAMINING LOCATIONS IN A WAFER WITH ADJUSTABLE NAVIGATION...
Publication number
20190234887
Publication date
Aug 1, 2019
APPLIED MATERIALS ISRAEL LTD.
Idan KAIZERMAN
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF GENERATING AN EXAMINATION RECIPE AND SYSTEM THEREOF
Publication number
20190080447
Publication date
Mar 14, 2019
APPLIED MATERIALS ISRAEL LTD.
Ariel SHKALIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF DESIGN-BASED DEFECT CLASSIFICATION AND SYSTEM THEREOF
Publication number
20150356719
Publication date
Dec 10, 2015
APPLIED MATERIALS ISRAEL LTD.
MARK GESHEL
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF DESIGN-BASED DEFECT CLASSIFICATION AND SYSTEM THEREOF
Publication number
20140212022
Publication date
Jul 31, 2014
APPLIED MATERIALS ISRAEL LTD.
MARK GESHEL
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF GENERATING A RECIPE FOR A MANUFACTURING TOOL AND SYSTEM T...
Publication number
20130326443
Publication date
Dec 5, 2013
APPLIED MATERIALS ISRAEL LTD.
Mark Geshel
G01 - MEASURING TESTING