Mark Geshel

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Kfar-Sava, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method for pattern inspection
- Patent number 7,155,052
- Issue date Dec 26, 2006
- Tokyo Seimitsu (Israel) Ltd
- Mark Geshel
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method for pattern inspection
- Publication number 20030228050
- Publication date Dec 11, 2003
- Tokyo Seimitsu Israel Ltd.
- Mark Geshel
- G06 - COMPUTING CALCULATING COUNTING