Mark H. Van Benthem

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Middletown, DE, US

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Patents Grantslast 30 patents

Information Patent Grant
Global analysis peak fitting for chemical spectroscopy data
- Patent number 10,551,247
- Issue date Feb 4, 2020
- National Technology & Engineering Solutions of Sandia, LLC
- Mark Van Benthem
- G01 - MEASURING TESTING
Information Patent Grant
Method for factor analysis of GC/MS data
- Patent number 8,266,197
- Issue date Sep 11, 2012
- Sandia Corporation
- Mark H. Van Benthem
- G01 - MEASURING TESTING
Information Patent Grant
Method to analyze remotely sensed spectral data
- Patent number 7,491,944
- Issue date Feb 17, 2009
- Sandia Corporation
- Christopher L. Stork
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fast combinatorial algorithm for the solution of linearly constrain...
- Patent number 7,451,173
- Issue date Nov 11, 2008
- Sandia Corporation
- Mark H. Van Benthem
- G06 - COMPUTING CALCULATING COUNTING