Mark Hansen

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus for measuring a characteristic of a device under test
- Patent number 8,319,503
- Issue date Nov 27, 2012
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test system for flicker noise
- Publication number 20100127714
- Publication date May 27, 2010
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING