Mark J. Beaulieu

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Sutton, MA, US

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Patents Applicationslast 30 patents

Information Patent Application
FLATNESS TESTING FOR CATHODES
- Publication number 20250003725
- Publication date Jan 2, 2025
- Raytheon Company
- Joaquim A. Bento
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED STRUCTURE, TWO RADAR MODULAR ASSEMBLY (RMA) STACKABLE RADAR
- Publication number 20230344143
- Publication date Oct 26, 2023
- Raytheon Company
- Craig H. McCordic
- G01 - MEASURING TESTING
Information Patent Application
COMPOSABLE RADAR
- Publication number 20220413090
- Publication date Dec 29, 2022
- Raytheon Company
- Brian J. Harkins
- H01 - BASIC ELECTRIC ELEMENTS