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Mark J. Emineth
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Minneapolis, MN, US
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last 30 patents
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Patent Grant
Analysis of noise in repetitive waveforms
Patent number
6,449,570
Issue date
Sep 10, 2002
Wavecrest Corporation
Jan B. Wilstrup
G01 - MEASURING TESTING
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Patent Grant
Measurement system with a frequency-dividing edge counter
Patent number
6,393,088
Issue date
May 21, 2002
Wavecrest Corporation
Mark J. Emineth
G04 - HOROLOGY
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Patent Grant
Analysis of noise in repetitive waveforms
Patent number
6,185,509
Issue date
Feb 6, 2001
Wavecrest Corporation
Jan B. Wilstrup
G01 - MEASURING TESTING