Mark J. Hagmann

Person

Salt Lake City, UT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of carrier profiling in semiconductors
- Patent number 10,401,382
- Issue date Sep 3, 2019
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Frequency comb feedback control for scanning probe microscopy
- Patent number 10,401,383
- Issue date Sep 3, 2019
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Method of carrier profiling utilizing dielectric relaxation
- Patent number 10,006,933
- Issue date Jun 26, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and algorithm for carrier profiling in scanning frequency...
- Patent number 9,927,461
- Issue date Mar 27, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Electrode control methodology for a scanning tunneling microscope
- Patent number 9,885,736
- Issue date Feb 6, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Scanning frequency comb microscopy (SFCM) for carrier profiling in...
- Patent number 9,442,078
- Issue date Sep 13, 2016
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Method and means for coupling high-frequency energy to and/or from...
- Patent number 9,075,081
- Issue date Jul 7, 2015
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture for scanning probe microscopy
- Patent number D695801
- Issue date Dec 17, 2013
- Mark J. Hagmann
- D16 - Photography and optical equipment
Information Patent Grant
Generation of a frequency comb and applications thereof
- Patent number 8,601,607
- Issue date Dec 3, 2013
- LOS ALAMOS NATIONAL SECURITY, LLC
- Mark J. Hagmann
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Symmetric field emission devices using distributed capacitive balla...
- Patent number 8,492,966
- Issue date Jul 23, 2013
- Mark J. Hagmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for measuring high frequency currents
- Patent number 6,566,854
- Issue date May 20, 2003
- Florida International University
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic devices in which a resonance between optical fields...
- Patent number 6,153,872
- Issue date Nov 28, 2000
- Florida International University for and on behalf of the Board of Regents
- Mark J. Hagmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric field and temperature probe
- Patent number 5,113,864
- Issue date May 19, 1992
- Florida International University
- Mark J. Hagmann
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Personal dosimeter
- Patent number 4,913,153
- Issue date Apr 3, 1990
- Florida International University
- Mark J. Hagmann
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
High frequency ammeter
- Patent number 4,897,600
- Issue date Jan 30, 1990
- Florida International University
- Mark J. Hagmann
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY
- Publication number 20210302466
- Publication date Sep 30, 2021
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Frequency Comb Feedback Control for Scanning Probe Microscopy
- Publication number 20180364278
- Publication date Dec 20, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Method of carrier profiling in semiconductors
- Publication number 20180275164
- Publication date Sep 27, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for carrier profiling of semiconductors utiliz...
- Publication number 20180172727
- Publication date Jun 21, 2018
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Algorithm for Carrier Profiling In Scanning Frequency...
- Publication number 20170307654
- Publication date Oct 26, 2017
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Method of Carrier Profiling Utilizing Dielectric Relaxation
- Publication number 20170199221
- Publication date Jul 13, 2017
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Electrode Control Methodology for a Scanning Tunneling Microscope
- Publication number 20160356807
- Publication date Dec 8, 2016
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Scanning Frequency Comb Microscopy (SFCM) For Carrier Profiling in...
- Publication number 20150247809
- Publication date Sep 3, 2015
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
Method and Means for Coupling High-Frequency Energy to and/or from...
- Publication number 20150067931
- Publication date Mar 5, 2015
- Mark J. Hagmann
- G01 - MEASURING TESTING
Information Patent Application
GENERATION OF A FREQUENCY COMB AND APPLICATIONS THEREOF
- Publication number 20130212751
- Publication date Aug 15, 2013
- LOS ALAMOS NATIONAL SECURITY, LLC
- Mark J. Hagmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Efficient high-frequency energy coupling in radiation-assisted fiel...
- Publication number 20030226961
- Publication date Dec 11, 2003
- Mark J. Hagmann
- H01 - BASIC ELECTRIC ELEMENTS

Mark J. Hagmann

Person

Patents Grantslast 30 patents

Method of carrier profiling in semiconductors

Frequency comb feedback control for scanning probe microscopy

Method of carrier profiling utilizing dielectric relaxation

Apparatus and algorithm for carrier profiling in scanning frequency...

Electrode control methodology for a scanning tunneling microscope

Scanning frequency comb microscopy (SFCM) for carrier profiling in...

Method and means for coupling high-frequency energy to and/or from...

Test fixture for scanning probe microscopy

Generation of a frequency comb and applications thereof

Symmetric field emission devices using distributed capacitive balla...

Apparatus for measuring high frequency currents

Optoelectronic devices in which a resonance between optical fields...

Electric field and temperature probe

Personal dosimeter

High frequency ammeter

Patents Applicationslast 30 patents

FREQUENCY COMB FEEDBACK CONTROL FOR SCANNING PROBE MICROSCOPY

Frequency Comb Feedback Control for Scanning Probe Microscopy

Method of carrier profiling in semiconductors

Method and Apparatus for carrier profiling of semiconductors utiliz...

Apparatus and Algorithm for Carrier Profiling In Scanning Frequency...

Method of Carrier Profiling Utilizing Dielectric Relaxation

Electrode Control Methodology for a Scanning Tunneling Microscope

Scanning Frequency Comb Microscopy (SFCM) For Carrier Profiling in...

Method and Means for Coupling High-Frequency Energy to and/or from...

GENERATION OF A FREQUENCY COMB AND APPLICATIONS THEREOF

Efficient high-frequency energy coupling in radiation-assisted fiel...