Mark J. Tronolone

Person

Fairport, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometric roll-off measurement using a static fringe pattern
- Patent number 9,829,310
- Issue date Nov 28, 2017
- Corning Incorporated
- Alexander Timothy Bean
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Frequency-shifting interferometer with selective data processing
- Patent number 8,531,677
- Issue date Sep 10, 2013
- Corning Incorporated
- Thomas James Dunn
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of multiple surface test objects with frequency scannin...
- Patent number 7,986,414
- Issue date Jul 26, 2011
- Corning Incorporated
- Christopher Alan Lee
- G01 - MEASURING TESTING
Information Patent Grant
Current driven frequency-stepped radiation source and methods thereof
- Patent number 7,916,763
- Issue date Mar 29, 2011
- Corning Incorporated
- Thomas James Dunn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of assembling a composite data map having a closed-form solu...
- Patent number 7,593,599
- Issue date Sep 22, 2009
- Corning Incorporated
- Simon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Feature isolation for frequency-shifting interferometry
- Patent number 7,286,238
- Issue date Oct 23, 2007
- Corning Incorporated
- Christopher A. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Phase-resolved measurement for frequency-shifting interferometry
- Patent number 7,268,889
- Issue date Sep 11, 2007
- Corning Incorporated
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Overlapping common-path interferometers for two-sided measurement
- Patent number 7,268,887
- Issue date Sep 11, 2007
- Corning Incorporated
- Andrew W. Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Two-wavelength confocal interferometer for measuring multiple surfaces
- Patent number 6,781,699
- Issue date Aug 24, 2004
- Corning-Tropel
- Thomas J. Dunn
- G01 - MEASURING TESTING
Information Patent Grant
Fringe pattern discriminator for grazing incidence interferometer
- Patent number 6,757,067
- Issue date Jun 29, 2004
- Corning Incorporated
- Christopher A. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Fringe pattern discriminator for interferometer using diffraction g...
- Patent number 5,724,137
- Issue date Mar 3, 1998
- Tropel Corporation
- Mark J. Tronolone
- G01 - MEASURING TESTING
Information Patent Grant
Testing of recessed surfaces at grazing incidence
- Patent number 5,532,821
- Issue date Jul 2, 1996
- Tropel Corporation
- Mark J. Tronolone
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing aspherical optical surfaces with an interferometer
- Patent number 5,416,586
- Issue date May 16, 1995
- Tropel Corporation
- Mark J. Tronolone
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring artifact taper
- Patent number 5,349,434
- Issue date Sep 20, 1994
- Tropel Corporation
- Jon F. Fleig
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETRIC ROLL-OFF MEASUREMENT USING A STATIC FRINGE PATTERN
- Publication number 20170003120
- Publication date Jan 5, 2017
- Corning Incorporated
- Alexander Timothy Bean
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY-SHIFTING INTERFEROMETER WITH SELECTIVE DATA PROCESSING
- Publication number 20110292405
- Publication date Dec 1, 2011
- Thomas James Dunn
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF MULTIPLE SURFACE TEST OBJECTS WITH FREQUENCY SCANNIN...
- Publication number 20100195113
- Publication date Aug 5, 2010
- Christopher Alan Lee
- G01 - MEASURING TESTING
Information Patent Application
Current Driven Frequency-Stepped Radiation Source and Methods Thereof
- Publication number 20100128745
- Publication date May 27, 2010
- Thomas James Dunn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODE-MATCHING SYSTEM FOR TUNABLE EXTERNAL CAVITY LASER
- Publication number 20090185585
- Publication date Jul 23, 2009
- Nestor O Farmiga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A Method of Assembling a Composite Data Map Having a Closed-Form So...
- Publication number 20070003163
- Publication date Jan 4, 2007
- Corning Incorporated
- Simon Lee
- G01 - MEASURING TESTING
Information Patent Application
Mode-matching system for tunable external cavity laser
- Publication number 20060233205
- Publication date Oct 19, 2006
- Nestor O. Farmiga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Overlapping common-path interferometers for two-sided measurement
- Publication number 20060139656
- Publication date Jun 29, 2006
- Corning Incorporated
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Application
Phase-resolved measurement for frequency-shifting interferometry
- Publication number 20060061772
- Publication date Mar 23, 2006
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Application
Feature isolation for frequency-shifting interferometry
- Publication number 20060061773
- Publication date Mar 23, 2006
- Christopher A. Lee
- G01 - MEASURING TESTING
Information Patent Application
Two-wavelength confocal interferometer for measuring multiple surfaces
- Publication number 20040075842
- Publication date Apr 22, 2004
- Thomas J. Dunn
- G01 - MEASURING TESTING
Information Patent Application
FRINGE PATTERN DISCRIMINATOR FOR GRAZING INCIDENCE INTERFEROMETER
- Publication number 20040027579
- Publication date Feb 12, 2004
- Christopher A. Lee
- G01 - MEASURING TESTING

Mark J. Tronolone

Person

Patents Grantslast 30 patents

Interferometric roll-off measurement using a static fringe pattern

Frequency-shifting interferometer with selective data processing

Measurement of multiple surface test objects with frequency scannin...

Current driven frequency-stepped radiation source and methods thereof

Method of assembling a composite data map having a closed-form solu...

Feature isolation for frequency-shifting interferometry

Phase-resolved measurement for frequency-shifting interferometry

Overlapping common-path interferometers for two-sided measurement

Two-wavelength confocal interferometer for measuring multiple surfaces

Fringe pattern discriminator for grazing incidence interferometer

Fringe pattern discriminator for interferometer using diffraction g...

Testing of recessed surfaces at grazing incidence

Method of testing aspherical optical surfaces with an interferometer

Method of measuring artifact taper

Patents Applicationslast 30 patents

INTERFEROMETRIC ROLL-OFF MEASUREMENT USING A STATIC FRINGE PATTERN

FREQUENCY-SHIFTING INTERFEROMETER WITH SELECTIVE DATA PROCESSING

MEASUREMENT OF MULTIPLE SURFACE TEST OBJECTS WITH FREQUENCY SCANNIN...

Current Driven Frequency-Stepped Radiation Source and Methods Thereof

MODE-MATCHING SYSTEM FOR TUNABLE EXTERNAL CAVITY LASER

A Method of Assembling a Composite Data Map Having a Closed-Form So...

Mode-matching system for tunable external cavity laser

Overlapping common-path interferometers for two-sided measurement

Phase-resolved measurement for frequency-shifting interferometry

Feature isolation for frequency-shifting interferometry

Two-wavelength confocal interferometer for measuring multiple surfaces

FRINGE PATTERN DISCRIMINATOR FOR GRAZING INCIDENCE INTERFEROMETER