Mark John MASLOW

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method for characterizing a manufacturing process of semiconductor...
- Patent number 11,860,548
- Issue date Jan 2, 2024
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Deep learning for semantic segmentation of pattern
- Patent number 11,847,570
- Issue date Dec 19, 2023
- ASML Netherlands B.V.
- Adrianus Cornelis Matheus Koopman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining control parameters of a device manufacturing...
- Patent number 11,768,442
- Issue date Sep 26, 2023
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system to monitor a process apparatus
- Patent number 11,733,610
- Issue date Aug 22, 2023
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Separation of contributions to metrology data
- Patent number 11,520,239
- Issue date Dec 6, 2022
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of determining control parameters of a device manufacturing...
- Patent number 11,513,442
- Issue date Nov 29, 2022
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep learning for semantic segmentation of pattern
- Patent number 11,379,970
- Issue date Jul 5, 2022
- ASML Netherlands B.V.
- Adrianus Cornelis Matheus Koopman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process window tracker
- Patent number 10,866,523
- Issue date Dec 15, 2020
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to monitor a process apparatus
- Patent number 10,571,806
- Issue date Feb 25, 2020
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
A METHOD FOR CHARACTERIZING A MANUFACTURING PROCESS OF SEMICONDUCTO...
- Publication number 20240111218
- Publication date Apr 4, 2024
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...
- Publication number 20240012337
- Publication date Jan 11, 2024
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM TO MONITOR A PROCESS APPARATUS
- Publication number 20240004299
- Publication date Jan 4, 2024
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...
- Publication number 20230058839
- Publication date Feb 23, 2023
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEPARATION OF CONTRIBUTIONS TO METROLOGY DATA
- Publication number 20230042759
- Publication date Feb 9, 2023
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPEC...
- Publication number 20220375063
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING DEFECTIVENESS OF PATTERN BASED ON AFTER DEVE...
- Publication number 20220342316
- Publication date Oct 27, 2022
- ASML NETHERLANDS B.V.
- Marleen KOOIMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP LEARNING FOR SEMANTIC SEGMENTATION OF PATTERN
- Publication number 20220327686
- Publication date Oct 13, 2022
- ASML NETHERLANDS B.V.
- Adrianus Cornelis Matheus KOOPMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A METHOD FOR CHARACTERIZING A MANUFACTURING PROCESS OF SEMICONDUCTO...
- Publication number 20220100098
- Publication date Mar 31, 2022
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEEP LEARNING FOR SEMANTIC SEGMENTATION OF PATTERN
- Publication number 20210374936
- Publication date Dec 2, 2021
- ASML NETHERLANDS B.V.
- Adrianus Cornelis Matheus KOOPMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...
- Publication number 20210149312
- Publication date May 20, 2021
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM TO MONITOR A PROCESS APPARATUS
- Publication number 20200124968
- Publication date Apr 23, 2020
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS TO MONITOR A PROCESS APPARATUS
- Publication number 20190214318
- Publication date Jul 11, 2019
- ASML NETHERLANDS B.V.
- Mark John MASLOW
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM TO MONITOR A PROCESS APPARATUS
- Publication number 20190196334
- Publication date Jun 27, 2019
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEPARATION OF CONTRIBUTIONS TO METROLOGY DATA
- Publication number 20190086810
- Publication date Mar 21, 2019
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PROCESS WINDOW TRACKER
- Publication number 20180224752
- Publication date Aug 9, 2018
- ASML Netherlands B.V.
- Wim Tjibbo TEL
- H01 - BASIC ELECTRIC ELEMENTS

Mark John MASLOW

Person

Patents Grantslast 30 patents

Method for characterizing a manufacturing process of semiconductor...

Deep learning for semantic segmentation of pattern

Method of determining control parameters of a device manufacturing...

Method and system to monitor a process apparatus

Separation of contributions to metrology data

Method of determining control parameters of a device manufacturing...

Deep learning for semantic segmentation of pattern

Process window tracker

Method and system to monitor a process apparatus

Patents Applicationslast 30 patents

A METHOD FOR CHARACTERIZING A MANUFACTURING PROCESS OF SEMICONDUCTO...

METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...

METHOD AND SYSTEM TO MONITOR A PROCESS APPARATUS

METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...

SEPARATION OF CONTRIBUTIONS TO METROLOGY DATA

SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPEC...

METHOD FOR DETERMINING DEFECTIVENESS OF PATTERN BASED ON AFTER DEVE...

DEEP LEARNING FOR SEMANTIC SEGMENTATION OF PATTERN

A METHOD FOR CHARACTERIZING A MANUFACTURING PROCESS OF SEMICONDUCTO...

DEEP LEARNING FOR SEMANTIC SEGMENTATION OF PATTERN

METHOD OF DETERMINING CONTROL PARAMETERS OF A DEVICE MANUFACTURING...

METHOD AND SYSTEM TO MONITOR A PROCESS APPARATUS

METHOD AND APPARATUS TO MONITOR A PROCESS APPARATUS

METHOD AND SYSTEM TO MONITOR A PROCESS APPARATUS

SEPARATION OF CONTRIBUTIONS TO METROLOGY DATA

PROCESS WINDOW TRACKER