Mark Kelling

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Marlboro, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Critical dimension and pattern recognition structures for devices m...
- Patent number 8,932,961
- Issue date Jan 13, 2015
- GLOBALFOUNDRIES Inc.
- Sohan Mehta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a semiconductor arrangement with gate sidewall s...
- Patent number 7,279,386
- Issue date Oct 9, 2007
- Advanced Micro Devices, Inc.
- Mark C. Kelling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a semiconductor arrangement with reduced field-to...
- Patent number 7,223,698
- Issue date May 29, 2007
- Advanced Micro Devices, Inc.
- Douglas J. Bonser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming isolation trench with spacer formation
- Patent number 7,144,785
- Issue date Dec 5, 2006
- Advanced Micro Devices, Inc.
- Srikanteswara Dakshina-Murthy
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CRITICAL DIMENSION AND PATTERN RECOGNITION STRUCTURES FOR DEVICES M...
- Publication number 20150050811
- Publication date Feb 19, 2015
- GLOBALFOUNDRIES INC.
- Sohan Mehta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Critical Dimension and Pattern Recognition Structures for Devices M...
- Publication number 20130207108
- Publication date Aug 15, 2013
- GLOBALFOUNDRIES INC.
- Sohan Mehta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for forming a semiconductor arrangement with gate sidewall s...
- Publication number 20060121711
- Publication date Jun 8, 2006
- Advanced Micro Devices, Inc.
- Mark C. Kelling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming isolation trench with spacer formation
- Publication number 20060094205
- Publication date May 4, 2006
- Advanced Micro Devices, Inc.
- Srikanteswara Dakshina-Murthy
- H01 - BASIC ELECTRIC ELEMENTS