Mark Kenneth Limkeman

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Brookfield, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for improving image quality
- Patent number 7,853,314
- Issue date Dec 14, 2010
- GE Medical Systems Global Technology Company, LLC
- Scott David Wollenweber
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Crystal-based coincidence timing calibration method
- Patent number 7,030,382
- Issue date Apr 18, 2006
- General Electric Company
- John J. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Crystal-based coincidence timing calibration method
- Patent number 6,852,978
- Issue date Feb 8, 2005
- General Electric Company
- John J. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Integrated CT-PET system
- Patent number 6,661,866
- Issue date Dec 9, 2003
- GE Medical Systems Global Technology Company, LLC
- Mark Kenneth Limkeman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Quiet mode magnetic resonance imaging system and method
- Patent number 6,452,391
- Issue date Sep 17, 2002
- General Electric Company
- Tsur Bernstein
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Crystal-based coincidence timing calibration method
- Publication number 20050156112
- Publication date Jul 21, 2005
- GE Medical Systems Global Technology Company, LLC
- John J. Williams
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for combining an anatomic structure and metabol...
- Publication number 20050015004
- Publication date Jan 20, 2005
- Sarah Rose Hertel
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Methods and apparatus for improving image quality
- Publication number 20040167387
- Publication date Aug 26, 2004
- Scott David Wollenweber
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Crystal-based coincidence timing calibration method
- Publication number 20040084625
- Publication date May 6, 2004
- John J. Williams
- G01 - MEASURING TESTING