Mark L. Guenther

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Noise-compensated jitter measurement instrument and methods
- Patent number 11,624,781
- Issue date Apr 11, 2023
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Grant
Method for performing joint jitter and amplitude noise analysis on...
- Patent number 9,294,237
- Issue date Mar 22, 2016
- Tektronix, Inc.
- Mark L. Guenther
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Computer system for automatically determining slew rate de-rating v...
- Patent number 8,670,947
- Issue date Mar 11, 2014
- Tektronix, Inc.
- G. R. N. Prasanth
- G01 - MEASURING TESTING
Information Patent Grant
Method for decomposing and analyzing jitter using spectral analysis...
- Patent number 8,594,169
- Issue date Nov 26, 2013
- Tektronix, Inc.
- Pavel Zivny
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for synthesizing and generating an SSC modulat...
- Patent number 8,165,184
- Issue date Apr 24, 2012
- Tektronix, Inc.
- Ramachandra Cv
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for decomposing timing jitter on arbitrary serial data seque...
- Patent number 7,254,168
- Issue date Aug 7, 2007
- Tektronix, Inc.
- Mark L. Guenther
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for representing complex vector data
- Patent number 7,006,092
- Issue date Feb 28, 2006
- Tektronix, Inc.
- Mark L. Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of identifying spectral impulses for Rj Dj separation
- Patent number 6,853,933
- Issue date Feb 8, 2005
- Tektronix, Inc.
- Kan Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for spectrum analysis-based serial data jitter...
- Patent number 6,832,172
- Issue date Dec 14, 2004
- Tektronix, Inc.
- Benjamin A. Ward
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for representing complex vector data
- Patent number 6,735,554
- Issue date May 11, 2004
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR SEPARATING AND MODELING N-UI JITTER BASED ON SPECTRUM
- Publication number 20240369625
- Publication date Nov 7, 2024
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION
- Publication number 20240255572
- Publication date Aug 1, 2024
- Tektronix, Inc.
- Muhammad Saad Chughtai
- G01 - MEASURING TESTING
Information Patent Application
SEMI-AUTOMATED OSCILLOSCOPE NOISE COMPENSATION BASED ON POWER SPECT...
- Publication number 20230324439
- Publication date Oct 12, 2023
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
NOISE-COMPENSATED JITTER MEASUREMENT INSTRUMENT AND METHODS
- Publication number 20220299566
- Publication date Sep 22, 2022
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
QUANTIFYING RANDOM TIMING JITTER THAT INCLUDES GAUSSIAN AND BOUNDED...
- Publication number 20190227109
- Publication date Jul 25, 2019
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PERFORMING JOINT JITTER AND AMPLITUDE NOISE ANALYSIS ON...
- Publication number 20160036568
- Publication date Feb 4, 2016
- Tektronix, Inc.
- Mark L. Guenther
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR DETERMINING A CORRELATED WAVEFORM ON A REAL TIME OSCILLO...
- Publication number 20160018443
- Publication date Jan 21, 2016
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DECOMPOSING AND ANALYZING JITTER USING SPECTRAL ANALYSIS...
- Publication number 20110292987
- Publication date Dec 1, 2011
- Tektronix, Inc.
- Pavel R. ZIVNY
- G01 - MEASURING TESTING
Information Patent Application
Method and System to Measure and Represent the Measured Value of a...
- Publication number 20110119688
- Publication date May 19, 2011
- Tektronix, Inc.
- G R N Prasanth
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for synthesizing and generating an SSC modulat...
- Publication number 20090207886
- Publication date Aug 20, 2009
- Tektronix.com
- Ramachandra CV
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Histograms, trends and spectrums of random and deterministic jitter
- Publication number 20050232345
- Publication date Oct 20, 2005
- Benjamin A. Ward
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method for decomposing timing jitter on arbitrary serial data seque...
- Publication number 20040136450
- Publication date Jul 15, 2004
- Mark L. Guenther
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for representing complex vector data
- Publication number 20030216892
- Publication date Nov 20, 2003
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for representing complex vector data
- Publication number 20030214505
- Publication date Nov 20, 2003
- Mark L. Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of identifying spectral impulses for Rj Dj separation
- Publication number 20030163268
- Publication date Aug 28, 2003
- Kan Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for spectrum analysis-based serial data jitter...
- Publication number 20030004664
- Publication date Jan 2, 2003
- Benjamin A. Ward
- G01 - MEASURING TESTING

Mark L. Guenther

Person

Patents Grantslast 30 patents

Noise-compensated jitter measurement instrument and methods

Method for performing joint jitter and amplitude noise analysis on...

Computer system for automatically determining slew rate de-rating v...

Method for decomposing and analyzing jitter using spectral analysis...

Apparatus and method for synthesizing and generating an SSC modulat...

Method for decomposing timing jitter on arbitrary serial data seque...

Method and apparatus for representing complex vector data

Method of identifying spectral impulses for Rj Dj separation

Apparatus and method for spectrum analysis-based serial data jitter...

Method and apparatus for representing complex vector data

Patents Applicationslast 30 patents

METHOD FOR SEPARATING AND MODELING N-UI JITTER BASED ON SPECTRUM

TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION

SEMI-AUTOMATED OSCILLOSCOPE NOISE COMPENSATION BASED ON POWER SPECT...

NOISE-COMPENSATED JITTER MEASUREMENT INSTRUMENT AND METHODS

QUANTIFYING RANDOM TIMING JITTER THAT INCLUDES GAUSSIAN AND BOUNDED...

METHOD FOR PERFORMING JOINT JITTER AND AMPLITUDE NOISE ANALYSIS ON...

METHOD FOR DETERMINING A CORRELATED WAVEFORM ON A REAL TIME OSCILLO...

METHOD FOR DECOMPOSING AND ANALYZING JITTER USING SPECTRAL ANALYSIS...

Method and System to Measure and Represent the Measured Value of a...

Apparatus and method for synthesizing and generating an SSC modulat...

Histograms, trends and spectrums of random and deterministic jitter

Method for decomposing timing jitter on arbitrary serial data seque...

Method and apparatus for representing complex vector data

Method and apparatus for representing complex vector data

Method of identifying spectral impulses for Rj Dj separation

Apparatus and method for spectrum analysis-based serial data jitter...