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Mark L. Little
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Auburn, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Automated inspection of soft-tooled hollow structure
Patent number
9,010,684
Issue date
Apr 21, 2015
The Boeing Company
William P. Motzer
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic inspection apparatus, system, and method
Patent number
7,640,811
Issue date
Jan 5, 2010
The Boeing Company
James C. Kennedy
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic inspection apparatus, system, and method
Patent number
7,640,810
Issue date
Jan 5, 2010
The Boeing Company
James C. Kennedy
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-frequency ultrasonic test probe, inspection system, and in...
Patent number
7,628,075
Issue date
Dec 8, 2009
The Boeing Company
James C. Kennedy
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic array probe apparatus, system, and method for traveling...
Patent number
7,337,673
Issue date
Mar 4, 2008
The Boeing Company
James C. Kennedy
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Automated Inspection of Soft-Tooled Hollow Structure
Publication number
20140005840
Publication date
Jan 2, 2014
THE BOEING COMPANY
William P. Motzer
G01 - MEASURING TESTING
Information
Patent Application
ULTRASONIC INSPECTION APPARATUS, SYSTEM, AND METHOD
Publication number
20090064787
Publication date
Mar 12, 2009
The Boeing Company
James C. Kennedy
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE-FREQUENCY ULTRASONIC TEST PROBE, INSPECTION SYSTEM, AND IN...
Publication number
20070227250
Publication date
Oct 4, 2007
James C. Kennedy
G01 - MEASURING TESTING
Information
Patent Application
Ultrasonic array probe apparatus, system, and method for traveling...
Publication number
20070006657
Publication date
Jan 11, 2007
The Boeing Company
James C. Kennedy
G01 - MEASURING TESTING
Information
Patent Application
Ultrasonic inspection apparatus, system, and method
Publication number
20070006658
Publication date
Jan 11, 2007
The Boeing Company
James C. Kennedy
G01 - MEASURING TESTING