Mark Lehmann

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Munich, DE

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Patents Grantslast 30 patents

Information Patent Grant
Testing of on-chip analog-mixed signal circuits using on-chip memory
- Patent number 11,961,577
- Issue date Apr 16, 2024
- NXP USA, INC.
- Kumar Abhishek
- G11 - INFORMATION STORAGE
Information Patent Grant
Analog-to-digital converter (ADC) testing
- Patent number 11,489,535
- Issue date Nov 1, 2022
- NXP B.V.
- Xiankun Jin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Devices and methods for voltage supply monitoring
- Patent number 11,422,201
- Issue date Aug 23, 2022
- NXP USA, INC.
- Sebastian Raschbacher
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
TESTING OF ON-CHIP ANALOG-MIXED SIGNAL CIRCUITS USING ON-CHIP MEMORY
- Publication number 20240013848
- Publication date Jan 11, 2024
- NXP USA, Inc.
- Kumar Abhishek
- G11 - INFORMATION STORAGE
Information Patent Application
ANALOG-TO-DIGITAL CONVERTER (ADC) TESTING
- Publication number 20220368338
- Publication date Nov 17, 2022
- NXP B.V.
- Xiankun Jin
- H03 - BASIC ELECTRONIC CIRCUITRY