MARK NOKES

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PALO ALTO, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Detection system for nanometer scale topographic measurements of re...
- Patent number 8,384,903
- Issue date Feb 26, 2013
- KLA-Tencor Corporation
- Henrik K. Nielsen
- G01 - MEASURING TESTING
Information Patent Grant
Detection system for nanometer scale topographic measurements of re...
- Patent number 7,342,672
- Issue date Mar 11, 2008
- KLA-Tencor Corporation
- Henrik K. Nielsen
- G01 - MEASURING TESTING
Information Patent Grant
Detection system for nanometer scale topographic measurements of re...
- Patent number 6,999,183
- Issue date Feb 14, 2006
- KLA-Tencor Corporation
- Henrik K. Nielsen
- G01 - MEASURING TESTING
Information Patent Grant
High sensitivity, large detection area particle sensor for vacuum a...
- Patent number 5,266,798
- Issue date Nov 30, 1993
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING
Information Patent Grant
Low cost stage for raster scanning of semiconductor wafers
- Patent number 5,212,580
- Issue date May 18, 1993
- High Yield Technology
- George L. Coad
- G02 - OPTICS
Information Patent Grant
High sensitivity, large detection area particle sensor for vacuum a...
- Patent number 5,132,548
- Issue date Jul 21, 1992
- High Yield Technology
- Peter Borden
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Detection system for nanometer scale topographic measurements of re...
- Publication number 20080225275
- Publication date Sep 18, 2008
- KLA-Tencor Corporation
- HENRIK K. NIELSEN
- G01 - MEASURING TESTING
Information Patent Application
Detection system for nanometer scale topographic measurements of re...
- Publication number 20060092427
- Publication date May 4, 2006
- Henrik K. Nielsen
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM FOR NANOMETER SCALE TOPOGRAPHIC MEASUREMENTS OF RE...
- Publication number 20010013936
- Publication date Aug 16, 2001
- KLA-Tencor Corporation
- HENRIK K. NIELSEN
- G01 - MEASURING TESTING