Mark P. Feilen

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Mukwonago, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Crystal-based coincidence timing calibration method
- Patent number 7,030,382
- Issue date Apr 18, 2006
- General Electric Company
- John J. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Crystal-based coincidence timing calibration method
- Patent number 6,852,978
- Issue date Feb 8, 2005
- General Electric Company
- John J. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Flash artifact suppression in two-dimensional ultrasound imaging
- Patent number 6,760,486
- Issue date Jul 6, 2004
- General Electric Company
- Richard Yung Chiao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Crystal-based coincidence timing calibration method
- Publication number 20050156112
- Publication date Jul 21, 2005
- GE Medical Systems Global Technology Company, LLC
- John J. Williams
- G01 - MEASURING TESTING
Information Patent Application
Crystal-based coincidence timing calibration method
- Publication number 20040084625
- Publication date May 6, 2004
- John J. Williams
- G01 - MEASURING TESTING