Mark R. Harless

Person

Plymouth, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 9,464,992
- Issue date Oct 11, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 9,337,071
- Issue date May 10, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- G01 - MEASURING TESTING
Information Patent Grant
Wafer holding mechanism
- Patent number 8,130,372
- Issue date Mar 6, 2012
- Rudolph Technologies, Inc.
- Mark Harless
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Edge inspection
- Patent number 7,822,260
- Issue date Oct 26, 2010
- Rudolph Technologies, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 7,729,528
- Issue date Jun 1, 2010
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer holding mechanism
- Patent number 7,703,823
- Issue date Apr 27, 2010
- Rudolph Technologies, Inc.
- Mark Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated wafer defect inspection system using backside illumination
- Patent number 7,629,993
- Issue date Dec 8, 2009
- Rudolph Technologies, Inc.
- Mark Harless
- G01 - MEASURING TESTING
Information Patent Grant
Edge inspection
- Patent number 7,340,087
- Issue date Mar 4, 2008
- Rudolph Technologies, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic focusing method and apparatus
- Patent number 7,321,108
- Issue date Jan 22, 2008
- Rudolph Technology, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic focusing method and apparatus
- Patent number 7,196,300
- Issue date Mar 27, 2007
- Rudolph Technologies, Inc.
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Grant
Inspection tool with a 3D point sensor to develop a focus map
- Patent number 7,170,075
- Issue date Jan 30, 2007
- Rudolph Technologies, Inc.
- Norman L. Oberski
- G01 - MEASURING TESTING
Information Patent Grant
Data transfer device with data frame grabber with switched fabric i...
- Patent number 7,111,095
- Issue date Sep 19, 2006
- August Technology Corp.
- Cory M. Watkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 6,937,753
- Issue date Aug 30, 2005
- August Technology Corp.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 6,826,298
- Issue date Nov 30, 2004
- August Technology Corp.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated wafer defect inspection system and a process of performin...
- Patent number 6,324,298
- Issue date Nov 27, 2001
- August Technology Corp.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Automated Wafer Defect Inspection System and a Process of Performin...
- Publication number 20160223470
- Publication date Aug 4, 2016
- Rudolph Technologies, Inc.
- Jeffrey L. O'Dell
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...
- Publication number 20120087569
- Publication date Apr 12, 2012
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...
- Publication number 20100239157
- Publication date Sep 23, 2010
- Rudolph Technologies, Inc.
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER HOLDING MECHANISM
- Publication number 20100166292
- Publication date Jul 1, 2010
- Mark Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EDGE INSPECTION
- Publication number 20080212084
- Publication date Sep 4, 2008
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC FOCUSING METHOD AND APPARTUS
- Publication number 20070114358
- Publication date May 24, 2007
- Cory Watkins
- G02 - OPTICS
Information Patent Application
Scheimpflug normalizer
- Publication number 20070057164
- Publication date Mar 15, 2007
- David Vaughnn
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Wafer holding mechanism
- Publication number 20060046396
- Publication date Mar 2, 2006
- Mark Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic focusing method and apparatus
- Publication number 20060033056
- Publication date Feb 16, 2006
- Cory Watkins
- G02 - OPTICS
Information Patent Application
Edge inspection
- Publication number 20050036671
- Publication date Feb 17, 2005
- Cory Watkins
- G01 - MEASURING TESTING
Information Patent Application
Automated wafer defect inspection system and a process of performin...
- Publication number 20050008218
- Publication date Jan 13, 2005
- Jeffrey O'Dell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Imaging system using theta-theta coordinate stage and continuous im...
- Publication number 20040179096
- Publication date Sep 16, 2004
- August Technology Corp.
- Mark R. Harless
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated wafer defect inspection system using backside illumination
- Publication number 20040061779
- Publication date Apr 1, 2004
- Mark Harless
- G01 - MEASURING TESTING
Information Patent Application
Inspection tool with a 3D point sensor to develop a focus map
- Publication number 20040056173
- Publication date Mar 25, 2004
- August Technology Corp.
- Norman L. Oberski
- G02 - OPTICS
Information Patent Application
Data grabber with switched fabric interface
- Publication number 20030221042
- Publication date Nov 27, 2003
- August Technology Corp.
- Cory M. Watkins
- G06 - COMPUTING CALCULATING COUNTING

Mark R. Harless

Person

Patents Grantslast 30 patents

Automated wafer defect inspection system and a process of performin...

Automated wafer defect inspection system and a process of performin...

Wafer holding mechanism

Edge inspection

Automated wafer defect inspection system and a process of performin...

Wafer holding mechanism

Automated wafer defect inspection system using backside illumination

Edge inspection

Dynamic focusing method and apparatus

Dynamic focusing method and apparatus

Inspection tool with a 3D point sensor to develop a focus map

Data transfer device with data frame grabber with switched fabric i...

Automated wafer defect inspection system and a process of performin...

Automated wafer defect inspection system and a process of performin...

Automated wafer defect inspection system and a process of performin...

Patents Applicationslast 30 patents

Automated Wafer Defect Inspection System and a Process of Performin...

AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...

AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMIN...

WAFER HOLDING MECHANISM

EDGE INSPECTION

DYNAMIC FOCUSING METHOD AND APPARTUS

Scheimpflug normalizer

Wafer holding mechanism

Dynamic focusing method and apparatus

Edge inspection

Automated wafer defect inspection system and a process of performin...

Imaging system using theta-theta coordinate stage and continuous im...

Automated wafer defect inspection system using backside illumination

Inspection tool with a 3D point sensor to develop a focus map

Data grabber with switched fabric interface