Mark R. Laforce

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Essex Junction, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Actively controlled heat sink for convective burn-in oven
- Patent number 6,504,392
- Issue date Jan 7, 2003
- International Business Machines Corporation
- John A. Fredeman
- G01 - MEASURING TESTING
Information Patent Grant
Segmented architecture for wafer test and burn-in
- Patent number 6,275,051
- Issue date Aug 14, 2001
- International Business Machines Corporation
- Thomas W. Bachelder
- G01 - MEASURING TESTING
Information Patent Grant
Mechanical fixture for holding electronic devices under test showin...
- Patent number 6,262,582
- Issue date Jul 17, 2001
- International Business Machines Corporation
- Dennis R. Barringer
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test and burn-in platform using ceramic tile supports
- Patent number 6,020,750
- Issue date Feb 1, 2000
- International Business Machines Corporation
- Daniel George Berger
- G01 - MEASURING TESTING
Information Patent Grant
Large area multiple-chip probe assembly and method of making the same
- Patent number 5,977,787
- Issue date Nov 2, 1999
- International Business Machines Corporation
- Gobina Das
- G01 - MEASURING TESTING
Information Patent Grant
Dry interface thermal chuck temperature control system for semicond...
- Patent number 5,001,423
- Issue date Mar 19, 1991
- International Business Machines Corporation
- Anthony J. Abrami
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
ACTIVELY CONTROLLED HEAT SINK FOR CONVECTIVE BURN-IN OVEN
- Publication number 20020075024
- Publication date Jun 20, 2002
- JOHN A. FREDEMAN
- G01 - MEASURING TESTING
Information Patent Application
Segmented architecture for wafer test & burn-in
- Publication number 20010050567
- Publication date Dec 13, 2001
- International Business Machines Corporation
- Thomas W. Bachelder
- G01 - MEASURING TESTING