Mark Schulze

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Patterned wafer inspection system using a non-vibrating contact pot...
- Patent number 8,275,564
- Issue date Sep 25, 2012
- Qcept Technologies, Inc.
- Mark A. Schulze
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Navigational display for parachutists
- Patent number 8,244,461
- Issue date Aug 14, 2012
- Nanohmics, Inc.
- Michael G. Durrett
- G01 - MEASURING TESTING
Information Patent Grant
Defect classification utilizing data from a non-vibrating contact p...
- Patent number 7,900,526
- Issue date Mar 8, 2011
- Qcept Technologies, Inc.
- Jeffrey Alan Hawthorne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration of non-vibrating contact potential difference measureme...
- Patent number 7,752,000
- Issue date Jul 6, 2010
- Qcept Technologies, Inc.
- Mark A. Schulze
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection system and apparatus utilizing a non-vibra...
- Patent number 7,659,734
- Issue date Feb 9, 2010
- Qcept Technologies, Inc.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Navigational Display for Parachutists
- Publication number 20100204910
- Publication date Aug 12, 2010
- Nanohmics, Inc.
- Michael G. Durrett
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED WAFER INSPECTION SYSTEM USING A NON-VIBRATING CONTACT POT...
- Publication number 20100198389
- Publication date Aug 5, 2010
- QCEPT TECHNOLOGIES, INC.
- Mark A. SCHULZE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Calibration of non-vibrating contact potential difference measureme...
- Publication number 20090276176
- Publication date Nov 5, 2009
- QCEPT TECHNOLOGIES, INC.
- Mark A. Schulze
- G01 - MEASURING TESTING
Information Patent Application
DEFECT CLASSIFICATION UTILIZING DATA FROM A NON-VIBRATING CONTACT P...
- Publication number 20090139312
- Publication date Jun 4, 2009
- QCEPT TECHNOLOGIES, INC.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor inspection system and apparatus utilizing a non-vibra...
- Publication number 20080217530
- Publication date Sep 11, 2008
- QCEPT TECHNOLOGIES, INC.
- Jeffrey Alan Hawthorne
- G01 - MEASURING TESTING
Information Patent Application
System and method for a vector difference mean filter for noise sup...
- Publication number 20060103892
- Publication date May 18, 2006
- Mark A. Schulze
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for acquiring and processing complex images
- Publication number 20040179738
- Publication date Sep 16, 2004
- X. Long Dai
- G06 - COMPUTING CALCULATING COUNTING

Mark Schulze

Person

Patents Grantslast 30 patents

Patterned wafer inspection system using a non-vibrating contact pot...

Navigational display for parachutists

Defect classification utilizing data from a non-vibrating contact p...

Calibration of non-vibrating contact potential difference measureme...

Semiconductor inspection system and apparatus utilizing a non-vibra...

Patents Applicationslast 30 patents

Navigational Display for Parachutists

PATTERNED WAFER INSPECTION SYSTEM USING A NON-VIBRATING CONTACT POT...

Calibration of non-vibrating contact potential difference measureme...

DEFECT CLASSIFICATION UTILIZING DATA FROM A NON-VIBRATING CONTACT P...

Semiconductor inspection system and apparatus utilizing a non-vibra...

System and method for a vector difference mean filter for noise sup...

System and method for acquiring and processing complex images