Mark W. Kimmel

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Lawrenceville, GA, US

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Patents Grantslast 30 patents

Information Patent Grant
High-throughput chiral detector and methods for using same
- Patent number 7,301,633
- Issue date Nov 27, 2007
- Georgia Institute of Technology
- Phillip Ray Gibbs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High-throughput chiral detector and methods for using same
- Publication number 20050094144
- Publication date May 5, 2005
- Phillip Ray Gibbs
- G01 - MEASURING TESTING