Mark W. Utlaut

Person

Saugus, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for laser machining
- Patent number 10,493,559
- Issue date Dec 3, 2019
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High aspect ratio X-ray targets and uses of same
- Patent number 10,366,860
- Issue date Jul 30, 2019
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Grant
High aspect ratio x-ray targets and uses of same
- Patent number 9,934,930
- Issue date Apr 3, 2018
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Lamella creation method and device using fixed-angle beam and rotat...
- Patent number 9,733,164
- Issue date Aug 15, 2017
- FEI Company
- Andrew B. Wells
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage isolation of an inductively coupled plasma ion source...
- Patent number 9,591,735
- Issue date Mar 7, 2017
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for attachment of an electrode into an inductively-coupled p...
- Patent number 9,530,625
- Issue date Dec 27, 2016
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for simultaneous detection of secondary electrons...
- Patent number 9,494,516
- Issue date Nov 15, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated light optics and gas delivery in a charged particle lens
- Patent number 9,478,390
- Issue date Oct 25, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-source plasma focused ion beam system
- Patent number 9,401,262
- Issue date Jul 26, 2016
- FEI Company
- Noel Smith
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Image-enhancing spotlight mode for digital microscopy
- Patent number 9,204,036
- Issue date Dec 1, 2015
- FEI Company
- Alan Bahm
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and structures for rapid switching between different proces...
- Patent number 9,159,534
- Issue date Oct 13, 2015
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for attachment of an electrode into a plasma source
- Patent number 9,053,895
- Issue date Jun 9, 2015
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microfluidics delivery systems
- Patent number 9,044,781
- Issue date Jun 2, 2015
- FEI Company
- Aurélien Philippe Jean Maclou Botman
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
System and method for simultaneous detection of secondary electrons...
- Patent number 9,040,909
- Issue date May 26, 2015
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Grant
Multi-source plasma focused ion beam system
- Patent number 9,029,812
- Issue date May 12, 2015
- FEI Company
- Noel Smith
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Encapsulation of electrodes in solid media
- Patent number 8,987,678
- Issue date Mar 24, 2015
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for attachment of an electrode into an inductively coupled p...
- Patent number 8,928,210
- Issue date Jan 6, 2015
- FEI Comapny
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system aperture
- Patent number 8,907,296
- Issue date Dec 9, 2014
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for laser machining a sample having a crystalline structure
- Patent number 8,853,592
- Issue date Oct 7, 2014
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
On-axis detector for charged particle beam system
- Patent number 8,759,764
- Issue date Jun 24, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-source plasma focused ion beam system
- Patent number 8,692,217
- Issue date Apr 8, 2014
- FEI Company
- Noel Smith
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Encapsulation of electrodes in solid media for use in conjunction w...
- Patent number 8,642,974
- Issue date Feb 4, 2014
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods and structures for rapid switching between different proces...
- Patent number 8,633,452
- Issue date Jan 21, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam masking for laser ablation micromachining
- Patent number 8,629,416
- Issue date Jan 14, 2014
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multi-source plasma focused ion beam system
- Patent number 8,405,054
- Issue date Mar 26, 2013
- FEI Company
- Noel Smith
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for localization of large numbers of fluorescent...
- Patent number 8,319,181
- Issue date Nov 27, 2012
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Grant
Combination laser and charged particle beam system
- Patent number 8,314,410
- Issue date Nov 20, 2012
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration-corrected wien ExB mass filter with removal of neutrals...
- Patent number 8,283,629
- Issue date Oct 9, 2012
- FEI Company
- David Tuggle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam masking for laser ablation micromachining
- Patent number 8,168,961
- Issue date May 1, 2012
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
In-chamber electron detector
- Patent number 8,164,059
- Issue date Apr 24, 2012
- FEI Company
- Robert Gerlach
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME
- Publication number 20180190467
- Publication date Jul 5, 2018
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ADAPTIVE CONTROL FOR CHARGED PARTICLE BEAM PROCESSING
- Publication number 20170002467
- Publication date Jan 5, 2017
- FEI Company
- Marcus Straw
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FUNCTIONALIZED GRIDS FOR LOCATING AND IMAGING BIOLOGICAL SPECIMENS...
- Publication number 20160032281
- Publication date Feb 4, 2016
- FEI Company
- Mark Utlaut
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS
- Publication number 20150380205
- Publication date Dec 31, 2015
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Simultaneous Detection of Secondary Electrons...
- Publication number 20150369737
- Publication date Dec 24, 2015
- FEI Company
- William Parker
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ATTACHMENT OF AN ELECTRODE INTO AN INDUCTIVELY-COUPLED P...
- Publication number 20150357166
- Publication date Dec 10, 2015
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Source Plasma Focused Ion Beam System
- Publication number 20150318140
- Publication date Nov 5, 2015
- FEI Company
- Noel Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME
- Publication number 20150303021
- Publication date Oct 22, 2015
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
High Voltage Isolation of an Inductively Coupled Plasma Ion Source...
- Publication number 20150102230
- Publication date Apr 16, 2015
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTI-SOURCE PLASMA FOCUSED ION BEAM SYSTEM
- Publication number 20140312245
- Publication date Oct 23, 2014
- FEI Company
- Noel Smith
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Methods and Structures for Rapid Switching Between Different Proces...
- Publication number 20140306607
- Publication date Oct 16, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microfluidics Delivery Systems
- Publication number 20140151335
- Publication date Jun 5, 2014
- Aurélien Philipp Jean Maclou Botman
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUS DETECTION OF SECONDARY ELECTRONS...
- Publication number 20140131573
- Publication date May 15, 2014
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
On-Axis Detector for Charged Particle Beam System
- Publication number 20140001357
- Publication date Jan 2, 2014
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lamella creation method and device using fixed-angle beam and rotat...
- Publication number 20130328246
- Publication date Dec 12, 2013
- FEI Company
- Andrew B. Wells
- G01 - MEASURING TESTING
Information Patent Application
Image-Enhancing Spotlight Mode for Digital Microscopy
- Publication number 20130307960
- Publication date Nov 21, 2013
- FEI Company
- Alan Bahm
- G02 - OPTICS
Information Patent Application
MULTI-SOURCE PLASMA FOCUSED ION BEAM SYSTEM
- Publication number 20130309421
- Publication date Nov 21, 2013
- FEI Company
- Noel Smith
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method and Apparatus for Actively Monitoring an Inductively-Coupled...
- Publication number 20130250293
- Publication date Sep 26, 2013
- FEI Company
- Mark W. Utlaut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System Aperture
- Publication number 20130181140
- Publication date Jul 18, 2013
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
System for Attachment of an Electrode into an Inductively Coupled P...
- Publication number 20130134855
- Publication date May 30, 2013
- FEI Company
- Sean Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Structures for Rapid Switching Between Different Proces...
- Publication number 20130015765
- Publication date Jan 17, 2013
- FEI Company
- Anthony Graupera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Encapsulation of Electrodes in Solid Media for use in conjunction w...
- Publication number 20120261587
- Publication date Oct 18, 2012
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ABERRATION-CORRECTED WIEN EXB MASS FILTER WITH REMOVAL OF NEUTRALS...
- Publication number 20120261566
- Publication date Oct 18, 2012
- FEI Company
- David Tuggle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-CHAMBER ELECTRON DETECTOR
- Publication number 20120199738
- Publication date Aug 9, 2012
- FEI Company
- ROBERT GERLACH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Masking for Laser Ablation Micromachining
- Publication number 20120200007
- Publication date Aug 9, 2012
- FEI Company
- MARCUS STRAW
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
System and Method for Localization of Large Numbers of Fluorescent...
- Publication number 20120193530
- Publication date Aug 2, 2012
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For Laser Machining
- Publication number 20120103945
- Publication date May 3, 2012
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Multi-Source Plasma Focused Ion Beam System
- Publication number 20120080407
- Publication date Apr 5, 2012
- FEI Company
- Noel Smith
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Encapsulation of Electrodes in Solid Media for use in conjunction w...
- Publication number 20110272592
- Publication date Nov 10, 2011
- FEI Company
- Sean Kellogg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Combination Laser and Charged Particle Beam System
- Publication number 20110248164
- Publication date Oct 13, 2011
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS

Mark W. Utlaut

Person

Patents Grantslast 30 patents

Method and apparatus for laser machining

High aspect ratio X-ray targets and uses of same

High aspect ratio x-ray targets and uses of same

Lamella creation method and device using fixed-angle beam and rotat...

High voltage isolation of an inductively coupled plasma ion source...

Method for attachment of an electrode into an inductively-coupled p...

System and method for simultaneous detection of secondary electrons...

Integrated light optics and gas delivery in a charged particle lens

Multi-source plasma focused ion beam system

Image-enhancing spotlight mode for digital microscopy

Methods and structures for rapid switching between different proces...

System for attachment of an electrode into a plasma source

Microfluidics delivery systems

System and method for simultaneous detection of secondary electrons...

Multi-source plasma focused ion beam system

Encapsulation of electrodes in solid media

System for attachment of an electrode into an inductively coupled p...

Charged particle beam system aperture

Method for laser machining a sample having a crystalline structure

On-axis detector for charged particle beam system

Multi-source plasma focused ion beam system

Encapsulation of electrodes in solid media for use in conjunction w...

Methods and structures for rapid switching between different proces...

Charged particle beam masking for laser ablation micromachining

Multi-source plasma focused ion beam system

System and method for localization of large numbers of fluorescent...

Combination laser and charged particle beam system

Aberration-corrected wien ExB mass filter with removal of neutrals...

Charged particle beam masking for laser ablation micromachining

In-chamber electron detector

Patents Applicationslast 30 patents

HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME

ADAPTIVE CONTROL FOR CHARGED PARTICLE BEAM PROCESSING

FUNCTIONALIZED GRIDS FOR LOCATING AND IMAGING BIOLOGICAL SPECIMENS...

INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS

System and Method for Simultaneous Detection of Secondary Electrons...

METHOD FOR ATTACHMENT OF AN ELECTRODE INTO AN INDUCTIVELY-COUPLED P...

Multi-Source Plasma Focused Ion Beam System

HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME

High Voltage Isolation of an Inductively Coupled Plasma Ion Source...

MULTI-SOURCE PLASMA FOCUSED ION BEAM SYSTEM

Methods and Structures for Rapid Switching Between Different Proces...

Microfluidics Delivery Systems

SYSTEM AND METHOD FOR SIMULTANEOUS DETECTION OF SECONDARY ELECTRONS...

On-Axis Detector for Charged Particle Beam System

Lamella creation method and device using fixed-angle beam and rotat...

Image-Enhancing Spotlight Mode for Digital Microscopy

MULTI-SOURCE PLASMA FOCUSED ION BEAM SYSTEM

Method and Apparatus for Actively Monitoring an Inductively-Coupled...

Charged Particle Beam System Aperture

System for Attachment of an Electrode into an Inductively Coupled P...

Methods and Structures for Rapid Switching Between Different Proces...

Encapsulation of Electrodes in Solid Media for use in conjunction w...

ABERRATION-CORRECTED WIEN EXB MASS FILTER WITH REMOVAL OF NEUTRALS...

IN-CHAMBER ELECTRON DETECTOR

Charged Particle Beam Masking for Laser Ablation Micromachining

System and Method for Localization of Large Numbers of Fluorescent...

Method And Apparatus For Laser Machining

Multi-Source Plasma Focused Ion Beam System

Encapsulation of Electrodes in Solid Media for use in conjunction w...

Combination Laser and Charged Particle Beam System