Mark WAGNER

Person

Rehovat, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for training and validating a perception system
- Patent number 12,093,834
- Issue date Sep 17, 2024
- Vaya Vision Sensing Ltd.
- Youval Nehmadi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Managing a change in a physical property of a vehicle due to an ext...
- Patent number 11,292,483
- Issue date Apr 5, 2022
- VayaVision Sensing, Ltd.
- Youval Nehmadi
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and system for process control with flexible sampling
- Patent number 10,754,260
- Issue date Aug 25, 2020
- KLA-Tencor Corporation
- Onur Demirer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology using overlay and yield critical patterns
- Patent number 10,685,165
- Issue date Jun 16, 2020
- KLA-Tencor Corporation
- Daniel Kandel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Virtual inspection systems for process window characterization
- Patent number 10,402,461
- Issue date Sep 3, 2019
- KLA-Tencor Corp.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Feed forward of metrology data in a metrology system
- Patent number 9,903,711
- Issue date Feb 27, 2018
- KLA-Tencor Corporation
- Ady Levy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Qualifying patterns for microlithography
- Patent number 9,612,541
- Issue date Apr 4, 2017
- KLA-Tencor Corporation
- Rui-fang Shi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for universal target based inspection and metrology
- Patent number 9,576,861
- Issue date Feb 21, 2017
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring positions of structures on a mask and thereby...
- Patent number 9,424,636
- Issue date Aug 23, 2016
- KLA-Tencor Corporation
- Frank Laske
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for evaluating a variation in a parameter of a pa...
- Patent number 8,160,350
- Issue date Apr 17, 2012
- Applied Materials Israel, Ltd.
- Michael Ben Yishai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,961,763
- Issue date Jun 14, 2011
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,843,559
- Issue date Nov 30, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects in wafers
- Patent number 7,813,541
- Issue date Oct 12, 2010
- Applied Materials South East Asia Pte. Ltd.
- Erez Sali
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects in wafers including alig...
- Patent number 7,804,993
- Issue date Sep 28, 2010
- Applied Materials South East Asia Pte. Ltd.
- Yuval Dorphan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining optimum position of focus of an imaging s...
- Patent number 7,633,041
- Issue date Dec 15, 2009
- Applied Materials South East Asia Pte, Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of water defects
- Patent number 7,525,659
- Issue date Apr 28, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,477,383
- Issue date Jan 13, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Automatic defect classification with invariant core classes
- Patent number 6,987,873
- Issue date Jan 17, 2006
- Applied Materials, Inc.
- Ariel Ben-Porath
- G01 - MEASURING TESTING
Information Patent Grant
Reliable defect detection using multiple perspective scanning elect...
- Patent number 5,659,172
- Issue date Aug 19, 1997
- Opal Technologies Ltd.
- Mark Wagner
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR TRAINING AND VALIDATING A PERCEPTION SYSTEM
- Publication number 20240419974
- Publication date Dec 19, 2024
- VAYAVISION SENSING LTD.
- Youval Nehmadi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUNCTIONAL SAFETY IN AUTONOMOUS DRIVING
- Publication number 20220363289
- Publication date Nov 17, 2022
- VAYAVISION SENSING LTD.
- Youval Nehmadi
- B60 - VEHICLES IN GENERAL
Information Patent Application
Methods and Systems for Training and Validating a Perception System
- Publication number 20220335729
- Publication date Oct 20, 2022
- VAYAVISION SENSING LTD.
- Youval Nehmadi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGING A CHANGE IN A PHYSICAL PROPERTY OF A VEHICLE DUE TO AN EXT...
- Publication number 20200062273
- Publication date Feb 27, 2020
- Youval Nehmadi
- B60 - VEHICLES IN GENERAL
Information Patent Application
Method and System for Process Control with Flexible Sampling
- Publication number 20160370718
- Publication date Dec 22, 2016
- KLA-Tencor Corporation
- Onur Demirer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Feed Forward of Metrology Data in a Metrology System
- Publication number 20160290796
- Publication date Oct 6, 2016
- KLA-Tencor Corporation
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY USING OVERLAY AND YIELD CRITICAL PATTERNS
- Publication number 20160253450
- Publication date Sep 1, 2016
- KLA-Tencor Corporation
- Daniel Kandel
- G01 - MEASURING TESTING
Information Patent Application
Virtual Inspection Systems for Process Window Characterization
- Publication number 20160150191
- Publication date May 26, 2016
- KLA-Tencor Corporation
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING POSITIONS OF STRUCTURES ON A MASK AND THEREBY...
- Publication number 20150248756
- Publication date Sep 3, 2015
- KLA-Tencor Corporation
- Frank LASKE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING THE POSITION OF DEFECTS ON OBJECT...
- Publication number 20150226539
- Publication date Aug 13, 2015
- KLA-Tencor Corporation
- Klaus-Dieter ROETH
- G01 - MEASURING TESTING
Information Patent Application
QUALIFYING PATTERNS FOR MICROLITHOGRAPHY
- Publication number 20150054940
- Publication date Feb 26, 2015
- KLA-Tencor Corporation
- Rui-fang Shi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Universal Target Based Inspection and Metrology
- Publication number 20140199791
- Publication date Jul 17, 2014
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING A VARIATION IN A PARAMETER OF A PA...
- Publication number 20090196487
- Publication date Aug 6, 2009
- APPLIED MATERIALS ISRAEL LTD.
- Michael Ben Yishai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070019856
- Publication date Jan 25, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070013903
- Publication date Jan 18, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244956
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244958
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244957
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting defects in wafers
- Publication number 20060193507
- Publication date Aug 31, 2006
- Negevtech Ltd.
- Erez Sali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for detecting defects in wafers including alig...
- Publication number 20060193506
- Publication date Aug 31, 2006
- Negevtech Ltd.
- Yuval Dorphan
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20050110987
- Publication date May 26, 2005
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20040146295
- Publication date Jul 29, 2004
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING

Mark WAGNER

Person

Patents Grantslast 30 patents

Methods and systems for training and validating a perception system

Managing a change in a physical property of a vehicle due to an ext...

Method and system for process control with flexible sampling

Metrology using overlay and yield critical patterns

Virtual inspection systems for process window characterization

Feed forward of metrology data in a metrology system

Qualifying patterns for microlithography

Method and system for universal target based inspection and metrology

Method for measuring positions of structures on a mask and thereby...

Method and system for evaluating a variation in a parameter of a pa...

System for detection of wafer defects

System for detection of wafer defects

Method and apparatus for detecting defects in wafers

Method and apparatus for detecting defects in wafers including alig...

Apparatus for determining optimum position of focus of an imaging s...

System for detection of water defects

System for detection of wafer defects

Automatic defect classification with invariant core classes

Reliable defect detection using multiple perspective scanning elect...

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR TRAINING AND VALIDATING A PERCEPTION SYSTEM

FUNCTIONAL SAFETY IN AUTONOMOUS DRIVING

Methods and Systems for Training and Validating a Perception System

MANAGING A CHANGE IN A PHYSICAL PROPERTY OF A VEHICLE DUE TO AN EXT...

Method and System for Process Control with Flexible Sampling

Feed Forward of Metrology Data in a Metrology System

METROLOGY USING OVERLAY AND YIELD CRITICAL PATTERNS

Virtual Inspection Systems for Process Window Characterization

METHOD FOR MEASURING POSITIONS OF STRUCTURES ON A MASK AND THEREBY...

SYSTEM AND METHOD FOR DETERMINING THE POSITION OF DEFECTS ON OBJECT...

QUALIFYING PATTERNS FOR MICROLITHOGRAPHY

Method and System for Universal Target Based Inspection and Metrology

METHOD AND SYSTEM FOR EVALUATING A VARIATION IN A PARAMETER OF A PA...

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

Method and apparatus for detecting defects in wafers

Method and apparatus for detecting defects in wafers including alig...

System for detection of wafer defects

System for detection of wafer defects