Mark Wiltse

Person

  • Redwood City, CA, US

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PROCESS CONDITION MEASURING DEVICE

    • Publication number 20130029433
    • Publication date Jan 31, 2013
    • KLA-Tencor Corporation
    • Mei H. Sun
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Surface Coating

    • Publication number 20100080957
    • Publication date Apr 1, 2010
    • Integrated Surface Technologies
    • Jeffrey D. CHINN
    • C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
  • Information Patent Application

    PROCESS CONDITION MEASURING DEVICE

    • Publication number 20090056441
    • Publication date Mar 5, 2009
    • KLA-Tencor Corporation
    • Mei H. Sun
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Temperature effects on overlay accuracy

    • Publication number 20080204678
    • Publication date Aug 28, 2008
    • KLA-Tencor Technologies Corporation
    • Tony DiBiase
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Stylus having variable reflectivity and method for data input there...

    • Publication number 20040140963
    • Publication date Jul 22, 2004
    • David Kim
    • G06 - COMPUTING CALCULATING COUNTING