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Mark Windoloski
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Burlington, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Measurement system and method of use
Patent number
12,359,945
Issue date
Jul 15, 2025
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System and method for pit detection and sizing
Patent number
12,332,201
Issue date
Jun 17, 2025
JENTEK Sensors, Inc.
Neil J. Goldfine
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement system and method of use
Patent number
11,841,245
Issue date
Dec 12, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Measurement system and method of use
Patent number
11,549,831
Issue date
Jan 10, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system and method of use
Patent number
10,416,118
Issue date
Sep 17, 2019
JENTEK Sensors, Inc.
Neil J Goldfine
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Material condition assessment with eddy current sensors
Patent number
7,812,601
Issue date
Oct 12, 2010
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Absolute property measurements using electromagnetic sensors
Patent number
7,696,748
Issue date
Apr 13, 2010
Jentek Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid wound/etched winding constructs for scanning and monitoring
Patent number
7,518,360
Issue date
Apr 14, 2009
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Engine blade dovetail inspection
Patent number
7,451,639
Issue date
Nov 18, 2008
Jentek Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Local feature characterization using quasistatic electromagnetic se...
Patent number
7,289,913
Issue date
Oct 30, 2007
Jentek Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Grant
Self-monitoring metals, alloys and materials
Patent number
7,188,532
Issue date
Mar 13, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit having parallel drive segments and a plurality of sens...
Patent number
7,049,811
Issue date
May 23, 2006
Jentek Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current sensor arrays having drive windings with extended port...
Patent number
6,784,662
Issue date
Aug 31, 2004
Jentek Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20240255323
Publication date
Aug 1, 2024
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20230160728
Publication date
May 25, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
COMPLEX PART INSPECTION WITH EDDY CURRENT SENSORS
Publication number
20220412918
Publication date
Dec 29, 2022
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20220373367
Publication date
Nov 24, 2022
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SYSTEM AND METHOD FOR PIT DETECTION AND SIZING
Publication number
20220358630
Publication date
Nov 10, 2022
JENTEK Sensors, Inc.
Neil J. Goldfine
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20210080297
Publication date
Mar 18, 2021
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Material Condition Assessment with Eddy Current Sensors
Publication number
20100026285
Publication date
Feb 4, 2010
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Hybrid wound/etched winding constructs for scanning and monitoring
Publication number
20080258720
Publication date
Oct 23, 2008
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Engine blade dovetail inspection
Publication number
20070272042
Publication date
Nov 29, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Self-monitoring metals, alloys and materials
Publication number
20070227255
Publication date
Oct 4, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Material characterization with model based sensors
Publication number
20070069720
Publication date
Mar 29, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Material condition assessment with eddy current sensors
Publication number
20060244443
Publication date
Nov 2, 2006
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Automated drawing tool and method for drawing a sensor layout
Publication number
20060186880
Publication date
Aug 24, 2006
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
Local feature characterization using quasistatic electromagnetic se...
Publication number
20060097718
Publication date
May 11, 2006
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
Segmented field sensors
Publication number
20060076952
Publication date
Apr 13, 2006
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Segmented field sensors
Publication number
20050248339
Publication date
Nov 10, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Absolute property measurements using electromagnetic sensors
Publication number
20050127908
Publication date
Jun 16, 2005
JENTEK Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
Self-monitoring metals, alloys and materials
Publication number
20050083032
Publication date
Apr 21, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Weld characterization using eddy current sensors and arrays
Publication number
20050017713
Publication date
Jan 27, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Hybrid wound/etched winding constructs for scanning and monitoring
Publication number
20050007106
Publication date
Jan 13, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Eddy current sensor arrays having drive windings with extended port...
Publication number
20040232911
Publication date
Nov 25, 2004
JENTEK Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
High throughput absolute flaw imaging
Publication number
20040004475
Publication date
Jan 8, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
High resolution hidden damage imaging
Publication number
20030164700
Publication date
Sep 4, 2003
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Eddy current sensor arrays
Publication number
20030071615
Publication date
Apr 17, 2003
JENTEK Sensors
Darrell E. Schlicker
G01 - MEASURING TESTING